Showing results 1 to 4 of 4
Atomic force microscope 를 이용한 $Ge_2Sb_2Te_5$ 박막의 상변화 거동 및 전기적 특성평가 = The estimation of the phase change behavior and electrical property of $Ge_2Sb_2Te_5$ thin films using atomic force microscopelink 노기민; Roh, Ki-Min; et al, 한국과학기술원, 2005 |
Influence of N-2 gas pressure on the chemical bonds of amorphous carbon nitride films Roh, Ki-Min; You, Shin-Jae; Choi, Si-Kyung; Kim, Jung-Hyung; Seong, Dae-Jin, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.42, no.17, pp.175405 - 175411, 2009-09 |
RF magnetron sputtering 증착공정에서 플라즈마 특성과 비정질 $CN_x$ 박막성질의 상관관계에 관한 연구 = A study on the correlation between the plasma and amorphous $CN_x$ film characteristics using RF magnetron sputteringlink 노기민; Roh, Ki-Min; et al, 한국과학기술원, 2011 |
The effect of the magnetron sputtering gun size on the characteristics of the plasma and CN(x) film deposition Roh, Ki-Min; You, Shin-Jae; Kim, Dae-Woong; Han, Jun-Hee; Kim, Jung-Hyung; Seong, Dae-Jin, THIN SOLID FILMS, v.519, no.20, pp.6649 - 6653, 2011 |
Discover