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Memory-Augmented Convolutional Neural Networks With Triplet Loss for Imbalanced Wafer Defect Pattern Classification Hyun, Yunseung; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.622 - 634, 2020-11 |
Memory-augmented convolutional neural networks with triplet loss for imbalanced wafer defect pattern classification = 메모리가 결합된 합성곱 신경망을 이용한 불균형 웨이퍼 결함 패턴 분류link Hyun, Yunseung; Kim, Heeyoung; et al, 한국과학기술원, 2020 |
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