학위논문(석사) - 한국과학기술원 : 산업및시스템공학과, 2020.2,[iii, 19 p. :]
convolutional neural network▼aaugmented memory▼adefect pattern classification▼aclass imbalance▼awafer bin map▼asemiconductor manufacturing; 합성곱 신경망▼a결합된 메모리▼a결함 패턴 분류▼a클래스 불균형▼a웨이퍼빈맵▼a반도체공정
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