Browse by Subject CANTILEVERS
Showing results 15 to 21 of 21
| Parallelism error analysis and compensation for micro-force measurement Choi, IM; Kim, MS; Woo, SY; Kim, Soohyun, MEASUREMENT SCIENCE & TECHNOLOGY, v.15, pp.237 - 243, 2004-01 |
| Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology Shin, H; Hong, S; Moon, J; Jeon, JU, ULTRAMICROSCOPY, v.91, no.1-4, pp.103 - 110, 2002-05 |
| Routine femtogram-level chemical analyses using vibrational spectroscopy and self-cleaning scanning probe microscopy tips Park, Keunhan; Lee, Jungchul; Bhargava, Rohit; King, William P., ANALYTICAL CHEMISTRY, v.80, no.9, pp.3221 - 3228, 2008-05 |
| Suspended microchannel resonators with piezoresistive sensors Lee, Jungchul; Chunara, R.; Shen, W.; Payer, K.; Babcock, K.; Burg, T. P.; Manalis, S. R., LAB ON A CHIP, v.11, no.4, pp.645 - 651, 2011 |
| Temperature measurements of heated microcantilevers using scanning thermoreflectance microscopy Kim, Joohyun; Han, Sunwoo; Walsh, Timothy; Park, Keunhan; Lee, Bong Jae; King, William P.; Lee, Jungchul, REVIEW OF SCIENTIFIC INSTRUMENTS, v.84, no.3, 2013-03 |
| Temperature-dependent thermomechanical noise spectra of doped silicon microcantilevers Lee, Jungchul; Goericke, Fabian; King, William P., SENSORS AND ACTUATORS A-PHYSICAL, v.145, pp.37 - 43, 2008-07 |
| Tribological characteristics of probe tip and PZT media for AFM-based recording technology Chung, KH; Lee, YH; Kim, DE; Yoo, J; Hong, S, IEEE TRANSACTIONS ON MAGNETICS, v.41, no.2, pp.849 - 854, 2005-02 |
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