Showing results 7 to 9 of 9
Phase separation and stacking fault of InxGa1-xN layers grown on thick GaN and sapphire substrate by metalorganic chemical vapor deposition Cho, HK; Lee, JeongYong; Kim, KS; Yang, GM, JOURNAL OF CRYSTAL GROWTH, v.220, no.3, pp.197 - 203, 2000-12 |
TEM을 이용한 L10 FePt (001) 자성박막의 미세조직과 자기적 특성에 관한 연구 = A study of the microstructure and the magnetic property of L10 FePt (001) magnetic thin film using TEMlink 김아람; Kim, A-Ram; et al, 한국과학기술원, 2014 |
The structure of MCM-48 determined by electron crystallography Carlsson, A; Kaneda, M; Sakamoto, Y; Terasaki, O; Ryoo, Ryong; Joo, SH, JOURNAL OF ELECTRON MICROSCOPY, v.48, no.6, pp.795 - 798, 1999 |
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