Development of a fatigue testing system for thin films

Cited 20 time in webofscience Cited 0 time in scopus
  • Hit : 576
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorKim, Chung-Youbko
dc.contributor.authorSong, Ji-Hoko
dc.contributor.authorLee, Do-Youngko
dc.date.accessioned2013-03-09T02:02:45Z-
dc.date.available2013-03-09T02:02:45Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2009-
dc.identifier.citationINTERNATIONAL JOURNAL OF FATIGUE, v.31, no.4, pp.736 - 742-
dc.identifier.issn0142-1123-
dc.identifier.urihttp://hdl.handle.net/10203/95066-
dc.description.abstractOnly a few works on fatigue behavior of thin films under tension-tension loading can be found because of some limitations of a testing system. In this study, a fatigue testing system capable of performing load controlled tension-tension fatigue tests even for ductile thin films was developed by using an electrodynamic actuator. With the system, fatigue testing can be performed over a wide range of loading frequency. Besides, a capacitive displacement gauge was developed to measure the monotonic and cyclic deformation of thin films with high resolution during fatigue testing. As the displacement gauge is stable and its response is so fast, the displacement can be measured instantaneously and continuously during fatigue testing of high frequency. (C) 2008 Elsevier Ltd. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCI LTD-
dc.subjectMECHANICAL CHARACTERIZATION-
dc.subjectPOLYCRYSTALLINE SILICON-
dc.subjectCYCLE FATIGUE-
dc.subjectCOPPER FOILS-
dc.subjectSTRENGTH-
dc.titleDevelopment of a fatigue testing system for thin films-
dc.typeArticle-
dc.identifier.wosid000263709000017-
dc.identifier.scopusid2-s2.0-58249139906-
dc.type.rimsART-
dc.citation.volume31-
dc.citation.issue4-
dc.citation.beginningpage736-
dc.citation.endingpage742-
dc.citation.publicationnameINTERNATIONAL JOURNAL OF FATIGUE-
dc.identifier.doi10.1016/j.ijfatigue.2008.03.010-
dc.contributor.localauthorSong, Ji-Ho-
dc.contributor.nonIdAuthorKim, Chung-Youb-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorFatigue testing-
dc.subject.keywordAuthorThin films-
dc.subject.keywordAuthorTesting machine-
dc.subject.keywordAuthorDisplacement gauge-
dc.subject.keywordPlusMECHANICAL CHARACTERIZATION-
dc.subject.keywordPlusPOLYCRYSTALLINE SILICON-
dc.subject.keywordPlusCYCLE FATIGUE-
dc.subject.keywordPlusCOPPER FOILS-
dc.subject.keywordPlusSTRENGTH-
Appears in Collection
ME-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 20 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0