POINT-DEFECT FORMATION ON GRAPHITE SURFACE INDUCED BY ION IMPACT AT ENERGIES NEAR PENETRATION THRESHOLD

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It is shown that point defects are predominantly generated by irradiating low energy noble gas ions onto a graphite(0001) surface. Scanning tunneling microscopic images of the graphite surface irradiated with 50 eV Ar+ ions show a structure corresponding to a point defect in which only one or two surface atoms are displaced. The process of ion penetration and trapping into the graphite is investigated as a function of ion energy in the range of 1-500 eV. Trapping efficiency rapidly increases with ion energy in the threshold region (10-100 eV), and leads to a saturation for higher energies. The penetration and trapping mechanism is discussed in relation to defect formation on the surface.
Publisher
ELSEVIER SCIENCE BV
Issue Date
1992-04
Language
English
Article Type
Article; Proceedings Paper
Keywords

SCANNING TUNNELING MICROSCOPY

Citation

NUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v.67, no.1-4, pp.312 - 315

ISSN
0168-583X
URI
http://hdl.handle.net/10203/65783
Appears in Collection
CH-Journal Papers(저널논문)
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