Browse "ME-Journal Papers(저널논문)" by Subject 3D microscopy
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| High speed 3D surface profile without axial scanning: dual-detection confocal reflectance microscopy Lee, Dongryoung; Kim, Young-Duk; Gweon, Dae-Gab; Yoo, Hongki, MEASUREMENT SCIENCE & TECHNOLOGY, v.25, no.12, 2014-12 |
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