박막트랜지스터 구조에서의 비정질 규소의 상태밀도 측정과 준 안정성 연구Density of states measurement and metastability of amorphous silicon in thin film transistor structure

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dc.contributor.advisor이주천-
dc.contributor.advisorLee, Choo-Chon-
dc.contributor.author소회섭-
dc.contributor.authorSoh, Hoe-Sup-
dc.date.accessioned2011-12-14T07:25:57Z-
dc.date.available2011-12-14T07:25:57Z-
dc.date.issued1994-
dc.identifier.urihttp://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=68891&flag=dissertation-
dc.identifier.urihttp://hdl.handle.net/10203/47472-
dc.description학위논문(박사) - 한국과학기술원 : 물리학과, 1994.2, [ viii, 99 p. ]-
dc.languagekor-
dc.publisher한국과학기술원-
dc.title박막트랜지스터 구조에서의 비정질 규소의 상태밀도 측정과 준 안정성 연구-
dc.title.alternativeDensity of states measurement and metastability of amorphous silicon in thin film transistor structure-
dc.typeThesis(Ph.D)-
dc.identifier.CNRN68891/325007-
dc.description.department한국과학기술원 : 물리학과, -
dc.identifier.uid000815139-
dc.contributor.localauthor소회섭-
dc.contributor.localauthorSoh, Hoe-Sup-
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PH-Theses_Ph.D.(박사논문)
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