박막트랜지스터 구조에서의 비정질 규소의 상태밀도 측정과 준 안정성 연구Density of states measurement and metastability of amorphous silicon in thin film transistor structure
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 이주천 | - |
| dc.contributor.advisor | Lee, Choo-Chon | - |
| dc.contributor.author | 소회섭 | - |
| dc.contributor.author | Soh, Hoe-Sup | - |
| dc.date.accessioned | 2011-12-14T07:25:57Z | - |
| dc.date.available | 2011-12-14T07:25:57Z | - |
| dc.date.issued | 1994 | - |
| dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=68891&flag=dissertation | - |
| dc.identifier.uri | http://hdl.handle.net/10203/47472 | - |
| dc.description | 학위논문(박사) - 한국과학기술원 : 물리학과, 1994.2, [ viii, 99 p. ] | - |
| dc.language | kor | - |
| dc.publisher | 한국과학기술원 | - |
| dc.title | 박막트랜지스터 구조에서의 비정질 규소의 상태밀도 측정과 준 안정성 연구 | - |
| dc.title.alternative | Density of states measurement and metastability of amorphous silicon in thin film transistor structure | - |
| dc.type | Thesis(Ph.D) | - |
| dc.identifier.CNRN | 68891/325007 | - |
| dc.description.department | 한국과학기술원 : 물리학과, | - |
| dc.identifier.uid | 000815139 | - |
| dc.contributor.localauthor | 소회섭 | - |
| dc.contributor.localauthor | Soh, Hoe-Sup | - |
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- PH-Theses_Ph.D.(박사논문)
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