Femtosecond pulses for 3-D surface measurement of microelectronic step-structures

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We present a fast and precise 3-D measurement of microelectronic step-structures over a wide field-of-view by utilizing high spatial coherence, low temporal coherence and repetition rate tunablility of femtosecond laser pulses.
Publisher
The Optical Society (OSA)
Issue Date
2014-06
Language
English
Citation

2014 Conference on Lasers and Electro-Optics, CLEO 2014

URI
http://hdl.handle.net/10203/273187
Appears in Collection
ME-Conference Papers(학술회의논문)
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