DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Yong Keun | ko |
dc.contributor.author | Shin, Seungwoo | ko |
dc.contributor.author | Park, Gwang Sik | ko |
dc.date.accessioned | 2019-04-15T15:19:13Z | - |
dc.date.available | 2019-04-15T15:19:13Z | - |
dc.date.issued | 2018-09-25 | - |
dc.identifier.uri | http://hdl.handle.net/10203/254953 | - |
dc.description.abstract | An ultra-high-speed 3D refractive index tomography and structured illumination microscopy system using a wavefront shaper and a method using the same are provided. A method of using an ultra-high-speed 3D refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper includes adjusting an irradiation angle of a plane wave incident on a sample by using the wavefront shaper, measuring a 2D optical field, which passes through the sample, based on the irradiation angle of the plane wave, and obtaining a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm. | - |
dc.title | 3D Refractive Index Tomogram and Structured Illumination Microscopy System using Wavefront Shaper and Method thereof | - |
dc.title.alternative | 파면 제어기를 이용한 초고속 3차원 굴절률 영상 촬영 및 형광 구조화 조도 현미경 시스템 및 이를 이용한 방법 | - |
dc.type | Patent | - |
dc.type.rims | PAT | - |
dc.contributor.localauthor | Park, Yong Keun | - |
dc.contributor.nonIdAuthor | Shin, Seungwoo | - |
dc.contributor.nonIdAuthor | Park, Gwang Sik | - |
dc.contributor.assignee | KAIST | - |
dc.identifier.iprsType | 특허 | - |
dc.identifier.patentApplicationNumber | 15243265 | - |
dc.identifier.patentRegistrationNumber | 10,082,662 | - |
dc.date.application | 2016-08-22 | - |
dc.date.registration | 2018-09-25 | - |
dc.publisher.country | US | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.