High resolution electrical resistance profiling of laboratory soil specimens
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jong-Sub | - |
| dc.contributor.author | Cho, Gye Chun | - |
| dc.date.accessioned | 2011-09-07T05:44:37Z | - |
| dc.date.available | 2011-09-07T05:44:37Z | - |
| dc.date.issued | 2005 | - |
| dc.identifier.citation | International Conference on Advanced Nondestructive Evaluation | en |
| dc.identifier.uri | http://hdl.handle.net/10203/25126 | - |
| dc.language.iso | en_US | en |
| dc.publisher | ANDE | en |
| dc.subject | Complex impedance | en |
| dc.subject | Electrical probe | en |
| dc.subject | Resistivity profiling | en |
| dc.subject | Spatial variability | en |
| dc.title | High resolution electrical resistance profiling of laboratory soil specimens | en |
| dc.type | Article | en |
- Appears in Collection
- CE-Conference Papers(학술회의논문)
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.