A new method for mapping the three-dimensional atomic distribution within nanoparticles by atom probe tomography (APT)

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We present a new method of preparing needle-shaped specimens for atom probe tomography from freestanding Pd and C-supported Pt nanoparticles. The method consists of two steps, namely electrophoresis of nanoparticles on a flat Cu substrate followed by electrodeposition of a Ni film acting as an embedding matrix for the nanoparticles. Atom probe specimen preparation can be subsequently carried out by means of focused-ion-beam milling. Using this approach, we have been able to perform correlative atom probe tomography and transmission electron microscopy analyses on both nanoparticle systems. Reliable mass spectra and three-dimensional atom maps could be obtained for Pd nanoparticle specimens. In contrast, atom probe samples prepared from C- supported Pt nanoparticles showed uneven field evaporation and hence artifacts in the reconstructed atom maps. Our developed method is a viable means of mapping the three-dimensional atomic distribution within nanoparticles and is expected to contribute to an improved understanding of the structure-composition-property relationships of various nanoparticle systems. (C) 2018 Elsevier B.V. All rights reserved.
Publisher
ELSEVIER SCIENCE BV
Issue Date
2018-07
Language
English
Article Type
Article
Citation

ULTRAMICROSCOPY, v.190, pp.30 - 38

ISSN
0304-3991
DOI
10.1016/j.ultramic.2018.04.005
URI
http://hdl.handle.net/10203/242522
Appears in Collection
CBE-Journal Papers(저널논문)MS-Journal Papers(저널논문)
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