Module grouping to reduce the area of test wrappers in SoCs

The number of wrapper cells which need to be added to SoCs for modular testing can be reduced by grouping modules so that they share wrappers. Such grouping may often increase test volume, which can be reduced by redesigning scan-chains and selectively eliminating some wrappers from the input and output ports of grouped modules. In experiments on benchmark circuits, an average of 61% of wrappers were removed when the increase in test time was constrained not to exceed 20%.
Publisher
ELSEVIER SCIENCE BV
Issue Date
ACCEPT
Language
English
Citation

INTEGRATION-THE VLSI JOURNAL, v.60, pp.39 - 47

ISSN
0167-9260
URI
http://hdl.handle.net/10203/228422
Appears in Collection
EE-Journal Papers(저널논문)
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