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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

A new probing system ibr the in-circuit test of a PCB

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dc.contributor.authorJ.H., Shim Jrko
dc.contributor.authorCho, Hyungsuckko
dc.contributor.authorS., Kim Jrko
dc.date.accessioned2007-11-21T02:04:04Z-
dc.date.available2007-11-21T02:04:04Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1996-04-
dc.identifier.citationbotics and Automation, 1996. Proceedings., 1996 IEEE International Conference on, pp.590 - 595-
dc.identifier.urihttp://hdl.handle.net/10203/2075-
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherIEEE-
dc.titleA new probing system ibr the in-circuit test of a PCB-
dc.typeConference-
dc.identifier.wosidA1996BF68P00093-
dc.type.rimsCONF-
dc.citation.beginningpage590-
dc.citation.endingpage595-
dc.citation.publicationnamebotics and Automation, 1996. Proceedings., 1996 IEEE International Conference on-
dc.identifier.conferencecountryUS-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorCho, Hyungsuck-
dc.contributor.nonIdAuthorJ.H., Shim Jr-
dc.contributor.nonIdAuthorS., Kim Jr-
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