Browse "School of Electrical Engineering(전기및전자공학부)" by Title
Showing results 16441 to 16460 of 51620
| Electric Field Effects on Intersubb and Transitions in Quantum Well Structure. 홍성철, v.3, no.0, pp.0 - 0, 1987-12 |
| Electric polarizability for a thick eccentric annular aperture with a floating inner conductor Park, YB; Eom, Hyo Joon, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.15, pp.265 - 267, 2005-04 |
| Electric polarizability for two circular apertures in parallel conducting planes Park, Y.B.; Eom, Hyo Joon, JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, v.16, no.4, pp.481 - 492, 2002 |
| Electric-field observation of pico-pulse propagation on right-angle bends by miniature photoconductive near-field probe Lee, J.; Kim, Joungho, IEEE MTT-S International Microwave Symposium Digest, 20002, pp.1509 - 1512, IEEE, 2002-06-02 |
| Electric-field-cycling-induced phase transformation method to obtain morphotropic phase boundary in HfxZr1-xO2 김성호; 문선국; 박우영; 조병진, 제29회 한국반도체학술대회, 연세대학교, 한국반도체산업협회, 한국반도체연구조합, 2022-01-24 |
| Electric-field-cycling-induced phase transformation method to obtain morphotropic phase boundary in HfxZr1-xO2 Kim, Seung Ho; Cho, Byung-Jin; Lee, Seung Hwan; Hwang, Wan Sik; Park, Woo Young, E-MRS 2021 Fall Meeting, European Materials Research Society, 2021-09-20 |
| Electrical Analysis for Wafer-Bonded Interfaces of p(+)GaAs/n(+)InGaAs and p(+)InGaAs/n(+)InGaAs Geum, Dae-Myeong; Kim, Seong Kwang; Lim, Hyeong-Rak; Park, Juhyuk; Jeong, Jaeyong; Han, Jae Hoon; Choi, Won Jun; et al, IEEE ELECTRON DEVICE LETTERS, v.42, no.6, pp.800 - 803, 2021-06 |
| Electrical and interfacial characterization of atomic layer deposited high-kappa gate dielectrics on GaAs for advanced CMOS devices Dalapati, Goutam Kumar; Tong, Yi; Loh, Wei-Yip; Mun, Hoe Keat; Cho, Byung Jin, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.54, no.8, pp.1831 - 1837, 2007-08 |
| Electrical and optical analysis of $MoTe_2$/Graphene heterostructure = $MoTe_2$/Graphene 헤테로구조의 전기적, 광학적 분석link Kim, Hojin; Choi, Sung-Yool; et al, 한국과학기술원, 2018 |
| Electrical and optical properties of area-variable varactor diode and GaAs MESFET with Bragg-reflector buffer = 면적변환 가변용량 다이오우드와 Bragg 반사기 버퍼를 가지는 갈륨비소 MESFET의 전기 및 광특성link Kim, Dong-Wook; 김동욱; et al, 한국과학기술원, 1996 |
| Electrical and Optical Properties of ZnO Thin Films Prepared by the Pyrosol Method 임굉수, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.29, no.2, pp.219 - 224, 1996-01 |
| ELECTRICAL AND OPTICAL-PROPERTIES OF DEEP-RED TOP-SURFACE-EMITTING LASERS SHIM, CS; YOO, JY; Lee, Yong-Hee; Shin, Sang Yung, IEEE PHOTONICS TECHNOLOGY LETTERS, v.4, no.10, pp.1084 - 1086, 1992-10 |
| Electrical and photocurrent properties of a polycrystalline Sn-doped beta-Ga2O3 thin film Yoon, Youngbin; Kim, Sunjae; Lee, In Gyu; Cho, Byung Jin; Hwang, Wan Sik, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.121, 2021-01 |
| Electrical and Physical Properties of ALD HfLaO for CMOS Device Application Cho, Byung Jin; He, W; Kim, SJ; Kim, YS, Material Research Society 2008 Spring Meeting, 2008-03-26 |
| Electrical and physical properties of Si1-xGex/HfO2/Si MOS-capacitors Cho, Byung Jin; Wu, N; Zhu, C; Balasubramanian, N; Yeo, CC; Joo, MS; Yu, HY, 2nd International Conference on Materials for Advanced Technologies, pp.535 - 535, 2003-12-11 |
| Electrical Biomolecule Detection Using Nanopatterned Silicon via Block Copolymer Lithography Jeong, Chang Kyu; Jin, Hyeong Min; Ahn, Jae-Hyuk; Park, Tae Jung; Yoo, Hyeon Gyun; Koo, Min; Choi, Yang-Kyu; et al, SMALL, v.10, no.2, pp.337 - 343, 2014-01 |
| Electrical Biomolecule Detection Using Nanopatterned Silicon via Self-assembled Block Copolymer Lithography Jeong, Chang Kyu; Jin, Hyeong Min; Ahn, Jae-Hyuk; Park, Tae Jung; Yoo, Hyeon Gyun; Koo, Min; Choi, Yang-Kyu; et al, 2013 MRS Spring Meeting & Exhibit, Materials Research Society, 2013-04-02 |
| Electrical Breakdown Characteristics of Solid-Gas Series Gaps Se-Kyo Chung; Ju-Jang Lee, JOURNAL OF THE KOREAN ELECTRICAL RESEARCH AND TESTING INSTITUTE, v.1, no.2, pp.12 - 20, 1977-01 |
| Electrical characteristic of nickel oxide film for the microbolometer Lee, Hee Chul; Lee, Yong Soo; Kim, Dong Soo, SPIE Defense, Security and Sensing, SPIE Defense, Security and Sensing, 2011 |
| Electrical characteristics analysis and comparison between through silicon via(TSV) and through glass via(TGV) Kim, Jihye; Hwang, Insu; Kim, Youngwoo; Kim, Heegon; Kim, Joungho; Sundaram, Venky; Tummala, Rao, IEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015, pp.93 - 96, Institute of Electrical and Electronics Engineers Inc., 2015-12 |
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