Browse "School of Electrical Engineering(전기및전자공학부)" by Subject ZNTE
Showing results 1 to 4 of 4
| Characterization of vacuum evaporated polycrystalline Cd0.96Zn0.04Te thin films by XRD, Raman scattering and spectroscopic ellipsometry Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.37, no.9, pp.964 - 975, 2002 |
| Influence of thermal annealing on the structural and optical properties of polycrystalline Cd0.96Zn0.04Te thin films Sridharan, MG; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, v.7, pp.1483 - 1491, 2005-06 |
| Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin films measured by spectroscopic ellipsometry Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.13, no.8, pp.471 - 476, 2002-08 |
| Raman scattering, photoluminescence and spectroscopic ellipsometry studies on polycrystalline Cd0.96Zn0.04Te thin films Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF ALLOYS AND COMPOUNDS, v.346, no.1-2, pp.100 - 106, 2002-11 |
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