Raman scattering, photoluminescence and spectroscopic ellipsometry studies on polycrystalline Cd0.96Zn0.04Te thin films

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Cd0.96Zn0.04Te thin films are deposited onto well-cleaned glass substrates (Coming 7059) kept at room temperature by vacuum evaporation. Rutherford backscattering spectrometry and X-ray diffraction techniques are used to determine the thickness, composition and crystalline structure and grain size of the films, respectively. The films exhibited zinc blende structure with predominant (111) orientation. The surface morphology of the films is studied by scanning electron microscopy and atomic force rnicroscopy. The rms roughness of the as-deposited films is 3.7 nm. The Raman spectra of the films show longitudinal- and transverse-optical (LO, TO) modes, which arise from CdTe- and ZnTe-like vibrations. The photoluminescence, spectrum of the films shows intense emission due to free and bound exciton recombination and no emission associated with crystal imperfection and deeper impurity levels. The pseudodielectric-function spectra, epsilon(E) = epsilon(1) (E) + iepsilon(2)(E), of the films are measured by spectroscopic ellipsometry at room temperature. The measured dielectric function spectra reveal distinct structures at energies of the E-1, E-1 + Delta(1) and E-2 critical points. (C) 2002 Elsevier Science B.V. All rights reserved.
Publisher
ELSEVIER SCIENCE SA
Issue Date
2002-11
Language
English
Article Type
Article
Keywords

OPTICAL-PROPERTIES; CADMIUM TELLURIDE; TERNARY ALLOYS; CDTE; CONSTANTS; CDZNTE; PARAMETERS; BULK; ZNTE

Citation

JOURNAL OF ALLOYS AND COMPOUNDS, v.346, no.1-2, pp.100 - 106

ISSN
0925-8388
URI
http://hdl.handle.net/10203/85489
Appears in Collection
EE-Journal Papers(저널논문)
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