Browse "School of Electrical Engineering(전기및전자공학부)" by Subject XRD

Showing results 1 to 5 of 5

1
Characterization of vacuum evaporated polycrystalline Cd0.96Zn0.04Te thin films by XRD, Raman scattering and spectroscopic ellipsometry

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chulresearcher, CRYSTAL RESEARCH AND TECHNOLOGY, v.37, no.9, pp.964 - 975, 2002

2
Effect of boron ion implantation on the structural and optical properties of polycrystalline Cd0.96Zn0.04Te thin films

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee-Chulresearcher, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v.201, no.3, pp.465 - 474, 2003-03

3
Effect of substrate temperature on polycrystalline Cd0.9Zn0.1Te thin films studied by Raman scattering spectroscopy

Sridharan, M; Mekaladevi, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chulresearcher, CRYSTAL RESEARCH AND TECHNOLOGY, v.39, pp.328 - 332, 2004-04

4
Optical and opto-electronic properties of polycrystalline Cd0.96Zn0.04Te thin films

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chulresearcher, CRYSTAL RESEARCH AND TECHNOLOGY, v.38, no.6, pp.479 - 487, 2003

5
Studies on polycrystalline Cd0.96Zn0.04Te thin films prepared by vacuum evaporation

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chulresearcher, VACUUM, v.70, pp.511 - 522, 2003-04

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