Effect of substrate temperature on polycrystalline Cd0.9Zn0.1Te thin films studied by Raman scattering spectroscopy

Cited 13 time in webofscience Cited 0 time in scopus
  • Hit : 205
  • Download : 0
Cd0.9Zn0.1Te thin films were prepared by vacuum evaporation onto well-cleaned glass substrates maintained at 300, 373 and 473 K. X-ray diffraction studies revealed that the films have zinc blende structure with preferential (I 11) orientation. Raman peak of the room temperature deposited film appeared at 140.30 cm(-1) and 159.65 cm(-1) were for the transverse optic (TO) and longitudinal optic (LO) phonons respectively. The XRD patterns of the higher substrate temperature deposited films exhibited an improvement in the crystallinity of the films. The Raman peak intensity increases and the FWHM decreases for the films deposited at higher substrate temperature. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Publisher
WILEY-V C H VERLAG GMBH
Issue Date
2004-04
Language
English
Article Type
Article
Keywords

CDZNTE; CDTE

Citation

CRYSTAL RESEARCH AND TECHNOLOGY, v.39, pp.328 - 332

ISSN
0232-1300
DOI
10.1002/crat.200310190
URI
http://hdl.handle.net/10203/85369
Appears in Collection
EE-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 13 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0