DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Seung-Woo | - |
dc.contributor.author | Choi, Minah | - |
dc.contributor.author | Hyun, Sangwon | - |
dc.contributor.author | Chun, Byung Jae | - |
dc.contributor.author | Kim, Seungman | - |
dc.contributor.author | Kim, Young Jin | - |
dc.date.accessioned | 2014-12-08T08:34:19Z | - |
dc.date.available | 2014-12-08T08:34:19Z | - |
dc.date.created | 2014-01-14 | - |
dc.date.issued | 2013-06-30 | - |
dc.identifier.citation | CLEO-PR &OECC/PS 2013, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/191687 | - |
dc.language | ENG | - |
dc.publisher | CLEO-PR &OECC/PS 2013 | - |
dc.title | Precision surface profile measurements by comb-based multi-wavelength interferometry | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | CLEO-PR &OECC/PS 2013 | - |
dc.identifier.conferencecountry | Japan | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.localauthor | Kim, Young Jin | - |
dc.contributor.nonIdAuthor | Choi, Minah | - |
dc.contributor.nonIdAuthor | Hyun, Sangwon | - |
dc.contributor.nonIdAuthor | Chun, Byung Jae | - |
dc.contributor.nonIdAuthor | Kim, Seungman | - |
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