Precision surface profile measurements by comb-based multi-wavelength interferometry

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dc.contributor.authorKim, Seung-Woo-
dc.contributor.authorChoi, Minah-
dc.contributor.authorHyun, Sangwon-
dc.contributor.authorChun, Byung Jae-
dc.contributor.authorKim, Seungman-
dc.contributor.authorKim, Young Jin-
dc.date.accessioned2014-12-08T08:34:19Z-
dc.date.available2014-12-08T08:34:19Z-
dc.date.created2014-01-14-
dc.date.issued2013-06-30-
dc.identifier.citationCLEO-PR &OECC/PS 2013, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/191687-
dc.languageENG-
dc.publisherCLEO-PR &OECC/PS 2013-
dc.titlePrecision surface profile measurements by comb-based multi-wavelength interferometry-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameCLEO-PR &OECC/PS 2013-
dc.identifier.conferencecountryJapan-
dc.contributor.localauthorKim, Seung-Woo-
dc.contributor.localauthorKim, Young Jin-
dc.contributor.nonIdAuthorChoi, Minah-
dc.contributor.nonIdAuthorHyun, Sangwon-
dc.contributor.nonIdAuthorChun, Byung Jae-
dc.contributor.nonIdAuthorKim, Seungman-
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ME-Conference Papers(학술회의논문)
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