Showing results 1 to 3 of 3
Electromigration Reliability of Barrierless Ruthenium and Molybdenum for Sub-10 nm Interconnection Kim, Jungkyun; Rhee, Hakseung; Son, Myeong Won; Park, Juseong; Kim, Gwangmin; Song, Hanchan; Kim, Geunwoo; et al, ACS APPLIED ELECTRONIC MATERIALS, v.5, no.5, pp.2447 - 2453, 2023-04 |
Joule heating-induced sp(2)-restoration in graphene fibers Noh, Sung Hyun; Eom, Wonsik; Lee, Won Jun; Park, Hun; Ambade, Swapnil B.; Kim, Sang Ouk; Han, Tae Hee, CARBON, v.142, pp.230 - 237, 2019-02 |
X-ray Irradiation Induced Reversible Resistance Change in Pt/TiO2/Pt Cells Chang, Seo Hyoung; Kim, Jungho; Phatak, Charudatta; D''Aquila, Kenneth; Kim, Seong Keun; Kim, Jiyoon; Song, Seul Ji; et al, ACS NANO, v.8, no.2, pp.1584 - 1589, 2014-02 |
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