A NEW PARAMETER EXTRACTION TECHNIQUE FOR SMALL-SIGNAL EQUIVALENT-CIRCUIT OF POLYSILICON EMITTER BIPOLAR-TRANSISTORS

We propose a new parameter extraction method for advanced polysilicon emitter bipolar transistors. This method is based on the predetermination of equivalent circuit parameters using the analytical expressions of de-embedded Z parameters of these devices. These parameter values are used as initial values for the parameter extraction process using optimization. The entire device equivalent circuit, containing RF probe pad and interconnection circuit parameters extracted by test structures, is optimized to fit measured S parameters for eliminating deembedding errors due to the imperfection of pad and inter-connection test structures. The equivalent circuit determined by this method shows excellent agreement with the measured S parameters from 0.1 to 26.5 GHz.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
1994-02
Language
ENG
Keywords

RESISTANCES; BASE

Citation

IEEE TRANSACTIONS ON ELECTRON DEVICES, v.41, no.2, pp.233 - 238

ISSN
0018-9383
URI
http://hdl.handle.net/10203/1662
Appears in Collection
MS-Journal Papers(저널논문)
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