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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

In-process layer surface inspection of SLA products

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dc.contributor.authorPark W.S.-
dc.contributor.authorKim M.Y.-
dc.contributor.authorLee H.G.-
dc.contributor.authorCho, Hyungsuck-
dc.contributor.authorLeu M.C.-
dc.date.accessioned2007-10-05T03:24:06Z-
dc.date.available2007-10-05T03:24:06Z-
dc.date.created2012-02-06-
dc.date.issued1998-11-02-
dc.identifier.citationIntelligent Systems in Design and Manufacturing, v.3517, no., pp.70 - 78-
dc.identifier.issn0277-786X-
dc.identifier.urihttp://hdl.handle.net/10203/1648-
dc.descriptionCopyright 1998 Society of Photo-Optical Instrumentation Engineers.en
dc.languageENG-
dc.language.isoen_USen
dc.publisherInternational Society for Optical Engineering (SPIE)-
dc.titleIn-process layer surface inspection of SLA products-
dc.typeConference-
dc.identifier.scopusid2-s2.0-0032225233-
dc.type.rimsCONF-
dc.citation.volume3517-
dc.citation.beginningpage70-
dc.citation.endingpage78-
dc.citation.publicationnameIntelligent Systems in Design and Manufacturing-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorCho, Hyungsuck-
dc.contributor.nonIdAuthorPark W.S.-
dc.contributor.nonIdAuthorKim M.Y.-
dc.contributor.nonIdAuthorLee H.G.-
dc.contributor.nonIdAuthorLeu M.C.-
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ME-Conference Papers(학술회의논문)
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