In-situ Monitoring of Degree of Imidization and In-plane Orientation of Polyimide Film with different thicknesses During Imidization

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dc.contributor.authorKim, HT-
dc.contributor.authorChoi, EJ-
dc.contributor.authorPark, Jung-Ki-
dc.date.accessioned2013-03-15T22:51:11Z-
dc.date.available2013-03-15T22:51:11Z-
dc.date.created2012-02-06-
dc.date.issued1996-05-01-
dc.identifier.citationMolecular Electronics and Devices Symposium, v., no., pp.0 - 0-
dc.identifier.urihttp://hdl.handle.net/10203/124768-
dc.languageENG-
dc.titleIn-situ Monitoring of Degree of Imidization and In-plane Orientation of Polyimide Film with different thicknesses During Imidization-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage0-
dc.citation.endingpage0-
dc.citation.publicationnameMolecular Electronics and Devices Symposium-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorPark, Jung-Ki-
dc.contributor.nonIdAuthorKim, HT-
dc.contributor.nonIdAuthorChoi, EJ-
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CBE-Conference Papers(학술회의논문)
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