The contact resistance and reliability of anisotropically conductive film (ACF)

The effect of bonding pressure on the electrical and mechanical properties of anisotropic conductive film (ACF) joint using nickel particles and metal-coated polymer bah-filled ACF's was investigated. The contact resistance decreases as the bonding pressure increases, Contact resistance of ACF is determined by the contact area change between particles and contact substrates. Electrical conduction through the pressure engaged contact area between conductive particles and conductor substrates is the main conduction mechanism in ACF interconnection. In addition, environmental effects on contact resistance and adhesion strength such as thermal aging, high temperature/humidity aging and temperature cycling were also investigated. Interestingly, the contact resistances of the excessively bonded samples deteriorated more than those of optimally bonded ones. Increasing contact resistance and decreasing adhesion strength after harsh environmental tests were mainly due to the loss of contact by thermal stress effect and moisture absorption, and also partially due to the formation of metal oxide on the conductive particles.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
1999-05
Language
ENG
Citation

IEEE TRANSACTIONS ON ADVANCED PACKAGING, v.22, no.2, pp.166 - 173

ISSN
1521-3323
URI
http://hdl.handle.net/10203/1227
Appears in Collection
MS-Journal Papers(저널논문)
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