DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, JW | ko |
dc.contributor.author | Seo, JM | ko |
dc.contributor.author | Kim, Sehun | ko |
dc.date.accessioned | 2009-09-21T04:58:57Z | - |
dc.date.available | 2009-09-21T04:58:57Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1996-05 | - |
dc.identifier.citation | SURFACE SCIENCE, v.351, no.1-3, pp.239 - 244 | - |
dc.identifier.issn | 0039-6028 | - |
dc.identifier.uri | http://hdl.handle.net/10203/11356 | - |
dc.description.abstract | The electronic properties of Na overlayers on Ge(111) are investigated using ultraviolet photoemission spectroscopy. Adsorption of Na atoms on Ge(111)-c(2 x 8) and Na/Ge(111)-3 x 1 surfaces does not change the semiconducting surface property. The Na/Ge(111)-3 x 1 surface is characterized using photoemission of adsorbed xenon. The local work function measurement shows that there are two different sites in (3 x 1) surface. One is close to Na atoms and its local work function is 0.48 eV lower than that of the other site. This Na-induced short range interacting area is about 33% of total surface, which indicates that the Na coverage of the (3 x 1) phase is about 1/3 ML. | - |
dc.description.sponsorship | Financial supports have partially been provided by the center for molecular science. One of us (J.M Seo) was supported by the basic science research institute program, Ministry of education, 1994, Project No. BSRI-94-2433. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | SI(111) SURFACE | - |
dc.subject | STRUCTURAL TRANSFORMATION | - |
dc.subject | SYNCHROTRON RADIATION | - |
dc.subject | ADSORBED XENON | - |
dc.subject | PHOTOEMISSION | - |
dc.subject | GE(111) | - |
dc.subject | RECONSTRUCTION | - |
dc.subject | NA | - |
dc.subject | ADSORPTION | - |
dc.subject | INTERFACES | - |
dc.title | Surface electronic properties of Na/Ge(111)-3x1 | - |
dc.type | Article | - |
dc.identifier.wosid | A1996UM63400003 | - |
dc.identifier.scopusid | 2-s2.0-0030143165 | - |
dc.type.rims | ART | - |
dc.citation.volume | 351 | - |
dc.citation.issue | 1-3 | - |
dc.citation.beginningpage | 239 | - |
dc.citation.endingpage | 244 | - |
dc.citation.publicationname | SURFACE SCIENCE | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Kim, Sehun | - |
dc.contributor.nonIdAuthor | Kim, JW | - |
dc.contributor.nonIdAuthor | Seo, JM | - |
dc.type.journalArticle | Letter | - |
dc.subject.keywordAuthor | alkali metals | - |
dc.subject.keywordAuthor | germanium | - |
dc.subject.keywordAuthor | low index single crystal surfaces | - |
dc.subject.keywordAuthor | metal-semiconductor interfaces | - |
dc.subject.keywordAuthor | photoelectron spectroscopy | - |
dc.subject.keywordAuthor | surface electronic phenomena | - |
dc.subject.keywordAuthor | xenon | - |
dc.subject.keywordAuthor | work function measurements | - |
dc.subject.keywordPlus | SI(111) SURFACE | - |
dc.subject.keywordPlus | STRUCTURAL TRANSFORMATION | - |
dc.subject.keywordPlus | SYNCHROTRON RADIATION | - |
dc.subject.keywordPlus | ADSORBED XENON | - |
dc.subject.keywordPlus | PHOTOEMISSION | - |
dc.subject.keywordPlus | GE(111) | - |
dc.subject.keywordPlus | RECONSTRUCTION | - |
dc.subject.keywordPlus | NA | - |
dc.subject.keywordPlus | ADSORPTION | - |
dc.subject.keywordPlus | INTERFACES | - |
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