DC Field | Value | Language |
---|---|---|
dc.contributor.author | LEE, YJ | ko |
dc.contributor.author | Kim, Sehun | ko |
dc.contributor.author | HWANG, CS | ko |
dc.contributor.author | LEE, C | ko |
dc.contributor.author | HWANG, CY | ko |
dc.date.accessioned | 2009-09-18T04:51:55Z | - |
dc.date.available | 2009-09-18T04:51:55Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1994-10 | - |
dc.identifier.citation | PHYSICAL REVIEW B, v.50, no.15, pp.11204 - 11207 | - |
dc.identifier.issn | 0163-1829 | - |
dc.identifier.uri | http://hdl.handle.net/10203/11305 | - |
dc.description.abstract | We have observed several reconstructions on a Si(100) surface with different annealing procedures. The observed reconstructed phases are the coexistence of the (2X2) phase and the (2X8) phase after high-temperature (greater than or similar to 950 K) annealing followed by quenching, and the half-order streak with the presence of the (2X1) phase after low-temperature (less than or similar to 950 K) annealing. The phase transition from the metastable (2X2) and (2X8) phases to the stable half-order streak is reversible upon annealing temperature and cooling rate. The distribution of kinks and missing dimer defects is expected to be the main cause of these reconstructions. | - |
dc.description.sponsorship | This work was supported by the Ability enhancement project at materials evaluation center, Koera Research Institute of standars and Science. Also, part of this work is supported by the center for molecular science at KAIST. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | AMERICAN PHYSICAL SOC | - |
dc.subject | SCANNING-TUNNELING-MICROSCOPY | - |
dc.subject | VACANCY DIFFUSION | - |
dc.subject | SI(001) | - |
dc.subject | TEMPERATURE | - |
dc.subject | DIFFRACTION | - |
dc.subject | KINETICS | - |
dc.subject | DIMERS | - |
dc.subject | STEPS | - |
dc.title | RECONSTRUCTION ON SI(100) SURFACES | - |
dc.type | Article | - |
dc.identifier.wosid | A1994PP12400100 | - |
dc.identifier.scopusid | 2-s2.0-0001255025 | - |
dc.type.rims | ART | - |
dc.citation.volume | 50 | - |
dc.citation.issue | 15 | - |
dc.citation.beginningpage | 11204 | - |
dc.citation.endingpage | 11207 | - |
dc.citation.publicationname | PHYSICAL REVIEW B | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Kim, Sehun | - |
dc.contributor.nonIdAuthor | LEE, YJ | - |
dc.contributor.nonIdAuthor | HWANG, CS | - |
dc.contributor.nonIdAuthor | LEE, C | - |
dc.contributor.nonIdAuthor | HWANG, CY | - |
dc.type.journalArticle | Note | - |
dc.subject.keywordPlus | SCANNING-TUNNELING-MICROSCOPY | - |
dc.subject.keywordPlus | VACANCY DIFFUSION | - |
dc.subject.keywordPlus | SI(001) | - |
dc.subject.keywordPlus | TEMPERATURE | - |
dc.subject.keywordPlus | DIFFRACTION | - |
dc.subject.keywordPlus | KINETICS | - |
dc.subject.keywordPlus | DIMERS | - |
dc.subject.keywordPlus | STEPS | - |
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