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College of Natural Sciences(자연과학대학)Dept. of Physics(물리학과)PH-Conference Papers(학술회의논문)

Annealing Behavior of Bias Induced Degradation in a-Si:H TFT's

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Issue Date
1990
Language
KOR
Citation

Tech.Digest on Korea-Japan Joint Sym. on Information Display, pp.115 - 118

URI
http://hdl.handle.net/10203/109570
Appears in Collection
PH-Conference Papers(학술회의논문)
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