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Showing results 78221 to 78240 of 279384
| Electrical characterization of interface property in Pt/(Ba, Sr)$TiO_3$/Pt structure for DRAM storage capacitor = DRAM 저장용 캐패시터를 위한 Pt/(Ba,Sr)$TiO_3$/Pt 구조에서의 계면의 전기적 특성 평가link Kwak, Dong-Hwa; 곽동화; et al, 한국과학기술원, 1998 |
| Electrical Characterization of Metal-Insulator-Semiconductor Capacitors Having Double-Layered Atomic-Layer-Deposited Al2O3 and ZnO for Transparent Thin Film Transistor Applications Yoon, Sung-Min; Park, Sang-Hee Ko; Byun, Chun-Won; Yang, Shin-Hyuk; Hwang, Chi-Sun, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.157, no.7, pp.727 - 733, 2010 |
| Electrical Characterization of n/p-Type Nickel Silicide/Silicon Junctions by Sb Segregation Jun, Myungsim; Park, Youngsam; Hyun, Younghoon; Choi, Sung-Jin; Jang, Moongyu; Zyung, Taehyung, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, no.8, pp.7339 - 7342, 2011 |
| Electrical Characterization of Nanoscale Au/TiO2 Schottky Diodes Probed with Conductive Atomic Force Microscopy Lee, Hyunsoo; Van, Trong Nghia; Park, JeongYoung, 한국진공학회 제 45회 하계학술대회, 한국진공학회, 2013-08-23 |
| Electrical Characterization of Nanoscale Au/TiO2 Schottky Diodes Probed with Conductive Atomic Force Microscopy 이현수; Lee, Young keun; Bae, Saebyuk; 박정영, 한국물리학회 2014년 봄 학술논문발표회 및 정기총회, 한국물리학회, 2014-04-24 |
| Electrical Characterization of PLT thin films by LP-MOCVD Kim, Ho Gi, Int. Sym. on Integ. Ferro., 1995-01-01 |
| Electrical characterization of PLT thin films by LP-MOCVD Lee, SS; Kim, Ho-Gi, INTEGRATED FERROELECTRICS, v.11, no.1-4, pp.137 - 144, 1995-11 |
| Electrical characterization of printed circuits on the fabric = 직물형 인쇄 회로 기판의 전기적 특성 연구link Kim, Yong-Sang; 김용상; et al, 한국과학기술원, 2008 |
| Electrical Characterization of Screen-Printed Circuits on the Fabric Kim, Yongsang; Kim, Hyejung; Yoo, Hoi-Jun, IEEE TRANSACTIONS ON ADVANCED PACKAGING, v.33, pp.196 - 205, 2010-02 |
| Electrical characterization of Trough Silicon Via (TSV) depending on structural and material parameters based on 3D full wave simulation Pak, J.S.; Ryu, C.; Kim, Joungho, International Conference on Electronic Materials and Packaging, EMAP 2007, IEEE, 2007-11-19 |
| Electrical characterization of wafer-bonded interfaces of p+InGaAs/n+InGaAs and p+GaAs/n+InGaAs Geum, Dae-Myeong; Kim, Seongkwang; Lim, Hyeongrak; Park, Juhyuk; Jeong, Jaeyong; Han, JaeHoon; Choi, WonJun; et al, Global Photovoltaic Conference 2021, Korea Photovoltaic Society (KPVS), 2021-07-07 |
| Electrical circuit model for quantifying the proliferation resistance of nuclear fuel cycles Ko, WI; Kim, HD; Yang, MS; Park, HS; Lee, Kun Jai, ANNALS OF NUCLEAR ENERGY, v.27, no.15, pp.1399 - 1425, 2000-10 |
| Electrical conductance and Anderson localization in carbon nanotubes with vacancy defects Lee, A. T.; Kang, Y.-J.; Chang, Kee-Joo, The 14th Asian Workshop on First-Principles Electronic Structure Calculations, The University of Tokyo, 2011-10 |
| Electrical conductance change of graphene-based devices upon surface modification for detecting botulinum neurotoxin Kim, Daehee; Kim, Ho-Jong; Shim, Seung-Bo; Jung, Suyong; Lee, Nam Hee; Nahm, Seung Hoon; Shin, Eui-Cheol; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.56, no.6, 2017-06 |
| Electrical conducting behavior of hybrid nanocomposites containing carbon nanotubes and carbon black Ma, PC; Zhang, H; Wang, SQ; Wong, YK; Tang, BZ; Hong, SH; Paik, Kyung-Wook; et al, The 9th International Conference on Electronic Materials and Packaging, EMAP 2007, pp.0 - 0, 2007-11-19 |
| Electrical Conduction and Defect Structure in SrTiO3 Thick Film Y.H. Kim; H.G. Kim, 한국세라믹학회지, v.27, no.32, pp.841 - 850, 1990 |
| Electrical Conduction Mechanism of RuO2 Based Thick Film Resistor 김호기, 한국세라믹학회지, v.31, no.12, pp.1529 - 1529, 1994-01 |
| Electrical Conduction of Partially Stabilized Zirconia as a Function of Temperature and Oxygen Partial Pressure Pyun, Su Il; y.-e.ihm, JOURNAL OF MATERIALS SCIENCE, v.17, no.9, pp.2577 - 2584, 1982 |
| Electrical Conductive CNT-PVA/PC Nanocomposites with High Tensile Elongation Jung, Eun H; Cha, Seung I; Jeong, Yong J; Hong, Soon-Hyung, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, no.1, pp.597 - 601, 2011-01 |
| Electrical Conductivity and Defect Models of MgO-Doped Cr2O3 J.S. Park; Kim, Ho Gi, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.71, no.3, pp.173 - 176, 1988 |
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