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Showing results 78221 to 78240 of 279406

78221
Electrical characterization of 2D and 3D microelectrodes for achieving high-resolution sensing in retinal prostheses with in vitro animal experimental results

Ko, Hyoungho; Lee, Sangmin, MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, v.23, no.2, pp.473 - 481, 2017-02

78222
Electrical characterization of bump-less high speed channel on silicon, organic and glass interposer

Lee, Hyunsuk; Kim, Hee-Gon; Kim, Kiyeong; Jung, Daniel Hyunsuk; Kim, Jonghoon J; Choi, Sumin; Lim, Jaemin; et al, 2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014, pp.850 - 854, Institute of Electrical and Electronics Engineers Inc., 2014-08

78223
Electrical characterization of dense and porous nanocrystalline Gd-doped ceria electrolytes

Jo, Seung Hwan; Muralidharan, P.; Kim, Do Kyung, SOLID STATE IONICS, v.178, no.39-40, pp.1990 - 1997, 2008-03

78224
Electrical characterization of dense and porous nanocrystalline Gd-doped ceria electrolytes

Jo, Seung Hwan; Muralidharan, P.; Kim, Do Kyung, Solid State Ionics, pp.1990 - 1997, Elsevier, 2008

78225
Electrical characterization of interface property in Pt/(Ba, Sr)$TiO_3$/Pt structure for DRAM storage capacitor = DRAM 저장용 캐패시터를 위한 Pt/(Ba,Sr)$TiO_3$/Pt 구조에서의 계면의 전기적 특성 평가link

Kwak, Dong-Hwa; 곽동화; et al, 한국과학기술원, 1998

78226
Electrical Characterization of Metal-Insulator-Semiconductor Capacitors Having Double-Layered Atomic-Layer-Deposited Al2O3 and ZnO for Transparent Thin Film Transistor Applications

Yoon, Sung-Min; Park, Sang-Hee Ko; Byun, Chun-Won; Yang, Shin-Hyuk; Hwang, Chi-Sun, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.157, no.7, pp.727 - 733, 2010

78227
Electrical Characterization of n/p-Type Nickel Silicide/Silicon Junctions by Sb Segregation

Jun, Myungsim; Park, Youngsam; Hyun, Younghoon; Choi, Sung-Jin; Jang, Moongyu; Zyung, Taehyung, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, no.8, pp.7339 - 7342, 2011

78228
Electrical Characterization of Nanoscale Au/TiO2 Schottky Diodes Probed with Conductive Atomic Force Microscopy

Lee, Hyunsoo; Van, Trong Nghia; Park, JeongYoung, 한국진공학회 제 45회 하계학술대회, 한국진공학회, 2013-08-23

78229
Electrical Characterization of Nanoscale Au/TiO2 Schottky Diodes Probed with Conductive Atomic Force Microscopy

이현수; Lee, Young keun; Bae, Saebyuk; 박정영, 한국물리학회 2014년 봄 학술논문발표회 및 정기총회, 한국물리학회, 2014-04-24

78230
Electrical Characterization of PLT thin films by LP-MOCVD

Kim, Ho Gi, Int. Sym. on Integ. Ferro., 1995-01-01

78231
Electrical characterization of PLT thin films by LP-MOCVD

Lee, SS; Kim, Ho-Gi, INTEGRATED FERROELECTRICS, v.11, no.1-4, pp.137 - 144, 1995-11

78232
Electrical characterization of printed circuits on the fabric = 직물형 인쇄 회로 기판의 전기적 특성 연구link

Kim, Yong-Sang; 김용상; et al, 한국과학기술원, 2008

78233
Electrical Characterization of Screen-Printed Circuits on the Fabric

Kim, Yongsang; Kim, Hyejung; Yoo, Hoi-Jun, IEEE TRANSACTIONS ON ADVANCED PACKAGING, v.33, pp.196 - 205, 2010-02

78234
Electrical characterization of Trough Silicon Via (TSV) depending on structural and material parameters based on 3D full wave simulation

Pak, J.S.; Ryu, C.; Kim, Joungho, International Conference on Electronic Materials and Packaging, EMAP 2007, IEEE, 2007-11-19

78235
Electrical characterization of wafer-bonded interfaces of p+InGaAs/n+InGaAs and p+GaAs/n+InGaAs

Geum, Dae-Myeong; Kim, Seongkwang; Lim, Hyeongrak; Park, Juhyuk; Jeong, Jaeyong; Han, JaeHoon; Choi, WonJun; et al, Global Photovoltaic Conference 2021, Korea Photovoltaic Society (KPVS), 2021-07-07

78236
Electrical circuit model for quantifying the proliferation resistance of nuclear fuel cycles

Ko, WI; Kim, HD; Yang, MS; Park, HS; Lee, Kun Jai, ANNALS OF NUCLEAR ENERGY, v.27, no.15, pp.1399 - 1425, 2000-10

78237
Electrical conductance and Anderson localization in carbon nanotubes with vacancy defects

Lee, A. T.; Kang, Y.-J.; Chang, Kee-Joo, The 14th Asian Workshop on First-Principles Electronic Structure Calculations, The University of Tokyo, 2011-10

78238
Electrical conductance change of graphene-based devices upon surface modification for detecting botulinum neurotoxin

Kim, Daehee; Kim, Ho-Jong; Shim, Seung-Bo; Jung, Suyong; Lee, Nam Hee; Nahm, Seung Hoon; Shin, Eui-Cheol; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.56, no.6, 2017-06

78239
Electrical conducting behavior of hybrid nanocomposites containing carbon nanotubes and carbon black

Ma, PC; Zhang, H; Wang, SQ; Wong, YK; Tang, BZ; Hong, SH; Paik, Kyung-Wook; et al, The 9th International Conference on Electronic Materials and Packaging, EMAP 2007, pp.0 - 0, 2007-11-19

78240
Electrical Conduction and Defect Structure in SrTiO3 Thick Film

Y.H. Kim; H.G. Kim, 한국세라믹학회지, v.27, no.32, pp.841 - 850, 1990

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