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Showing results 43061 to 43080 of 275604

43061
Characterization of Spastic Ankle Flexors Based on Viscoelastic Modeling for Accurate Diagnosis

Shin, Won-Seok; Chang, Handdeut; Kim, Sangjoon J.; Kim, Jung, INTERNATIONAL JOURNAL OF CONTROL AUTOMATION AND SYSTEMS, v.18, no.1, pp.102 - 113, 2020-01

43062
Characterization of spheroidal cancer models by invasive phenotypes

김지원; 조영빈; 정현태; 신현정, 2018 한국바이오칩학회 추계학술대회, 한국바이오칩학회, 2018-11-07

43063
CHARACTERIZATION OF SPIN-COATED SILICATE AND PHOSPHOSILICATE THIN-FILMS PREPARED BY THE SOL-GEL METHOD

NAM, CW; Woo, Seong-Ihl, THIN SOLID FILMS, v.237, no.1-2, pp.314 - 319, 1994-01

43064
Characterization of spin-on-glass films for planarization process

Nam, CW; Woo, Seong-Ihl, 한국화학공학회 추계학술발표회, 한국화학공학회, 1992-10

43065
Characterization of squalene-induced PgCYP736B involved in salt tolerance by modulating key genes of abscisic acid biosynthesis

Balusamy, Sri Renukadevi; Rahimi, Shadi; Yang, Deok-Chun, INTERNATIONAL JOURNAL OF BIOLOGICAL MACROMOLECULES, v.121, pp.796 - 805, 2019-01

43066
Characterization of Sr beta-alumina prepared by sol-gel and spray pyrolysis methods

Kalaignan, GP; Seo, DJ; Park, SeungBin, MATERIALS CHEMISTRY AND PHYSICS, v.85, no.2-3, pp.286 - 293, 2004-06

43067
Characterization of SrTiO3 thin film by Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Kim, Ho Gi, The 94th Annual Meeting of the Am. Ceram. Soc. (U.S.A.), 1992

43068
Characterization of SrTiO3 Thin Films Prepared by R.F. Magnetron Sputtering

Kim, Ho Gi, Kor.-Jap. New Ceramic Soc. (Japan), 1991

43069
CHARACTERIZATION OF SRTIO3 THIN-FILMS PREPARED BY RF MAGNETRON SPUTTERING

NAM, SH; CHO, NH; Kim, Ho Gi, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.25, no.4, pp.727 - 729, 1992-04

43070
Characterization of SSN coupling to signal via in multi-layer PCBs and packages

Park, J.; Kim, H.; Pak, J.S.; Kim, Joungho, 17th International Zurich Symposium on Electromagnetic Compatibility, 2006, pp.328 - 331, IEEE, 2006-02-27

43071
Characterization of stable protocrystallin silicon and its application to light-absorbing layers of amorphous silicon-based solar cells = 안정한 프로토크리스털 실리콘의 특성분석과 이 물질의 비정질 실리콘 태양전지 빛 흡수층으로의 응용link

Ahn, Jun-Yong; 안준용; et al, 한국과학기술원, 2003

43072
Characterization of Strain-dependent Behaviors of Deep Jointed Granites = 고심도 화강 절리 암반의 변형률 의존적 거동 특성파악link

Lee, Jun-Ho; 이준호; et al, 한국과학기술원, 2012

43073
Characterization of stress-dependent ultrasonic nonlinearity variation in concrete under cyclic loading using nonlinear resonant ultrasonic method

Park, Sun-Jong; Kim, Gyu Jin; Kwak, Hyo-Gyoung, CONSTRUCTION AND BUILDING MATERIALS, v.145, pp.272 - 282, 2017-08

43074
Characterization of structural irregularities in highly birefringent photonic crystal fiber based on polarization coupling by torsional acoustic wave

Hong, K.S.; Lee, K.J.; Yeom, D.I.; Kim, Byoung Yoon, 2010 Conference on Optical Fiber Communication, Collocated National Fiber Optic Engineers Conference, OFC/NFOEC 2010, Optical Society of America, 2010-03-21

43075
Characterization of structural irregularities in highly birefringent photonic crystal fiber using torsional acoustic polarization coupling

Hong, Kee Suk; Lee, Kwang Jo; Yeom, Dong-Il; Kim, Byoung Yoon, OPTICS COMMUNICATIONS, v.283, no.20, pp.4094 - 4098, 2010-10

43076
Characterization of Structural Variations in the Context of 3D Chromatin Structure

Kim, Kyukwang; Eom, Jung Hyun; Jung, Inkyung, MOLECULES AND CELLS, v.42, no.7, pp.512 - 522, 2019-07

43077
Characterization of Subgap Density-of-States by Sub-Bandgap Optical Charge Pumping in In0.53Ga0.47As Metal-Oxide-Semiconductor Field-Effect Transistors

Yoo, Han Bin; Kim, Seong Kwang; Kim, Junyeap; Yu, Jintae; Choi, Sung-Jin; Kim, Dae Hwan; Kim, Dong Myong, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.20, no.7, pp.4287 - 4291, 2020-07

43078
Characterization of Subsurface Damage in Si3N4 Ceramics with Static and Dynamic Indentation

Jong Ho Kim; 김도경; Young Gu Kim, 한국세라믹학회지, v.42, no.8, pp.537 - 541, 2005-08

43079
Characterization of subsurface damage of explosively indented silicon nitride ceramics

Kim, Jong Ho; Kim, Haneul; Kim, Do Kyung; Chang, Soon Nam, INTERNATIONAL JOURNAL OF MODERN PHYSICS B, v.22, no.9-11, pp.1504 - 1509, 2008-04

43080
CHARACTERIZATION OF SUBSURFACE DAMAGE OF EXPLOSIVELY INDENTED SILICON NITRIDE CERAMICS

KIM, JONG HO; KIM, HANEUL; KIM, DO KYUNG; CHANG, SOON NAM, International Journal of Modern Physics B, Vol.22, No.9, 10 &11, pp.1504-1509, 2008

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