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Showing results 198381 to 198400 of 279406

198381
Java-MaC: a Run-time Assurance Tool for Java Programs

Kim, Moonzoo; Kannan, S.; Lee, I.; Sokolsky, O., Runtime Verification, pp.218 - 235, Runtime Verification, 2001-07-23

198382
Temperature dependence of transmission and emission spectra in MOCVD-grown AlGaN ternary alloys

Cho, Yong-Hoon; Gainer, GH; Lam, JB; Song, JJ; Yang, W, The 4th International Conference on Nitride Semiconductors (ICNS-4), 2001-07-18

198383
비트율이급변되는재양자화계단크기선택방법및그를이용한비트율제어방법( )

김재균, 2001-07-18

198384
Near-field photoreflectance spectroscopic studies of semiconductor quantum well structures

Cho, Yong-Hoon; Jhe, W, Conference on Laser and Electro-Optics (CLEO)/Pacific Rim 2001, 2001-07-15

198385
Laser and electro optics of 21st century: From research to market

Kim, Byoung Yoon, 4th Pacific Rim Conference on Lasers and Electro-Optics, v.1, 2001-07-15

198386
Temporal characterization of compressor-controlled chirped pulses from a CPA Ti : sapphire laser

Hong, KH; Kang, YH; Cha, YH; Kim, JH; Nam, Chang Hee, 4th Pacific Rim Conference on Lasers and Electro-Optics, CLEO, 2001-07-15

198387
Tunable single-frequency Er3+-doped fiber laser using all-fiber acousto-optic bandpass filter

Yong, J.C.; Lee, M.S.; Kim, Byoung Yoon, 4th Pacific Rim Conference on Lasers and Electro-Optics, pp.0, CLEO, 2001-07-15

198388
A hybrid model of partial least squares and artificial neural network for analyzing process monitoring data

Kim, YS; Yum, Bong-Jin; Kim, M, International Joint Conference on Neural Networks (IJCNN'01), pp.2292 - 2297, IJCNN, 2001-07-15

198389
Time-frequency characteristics of high-order harmonics generated by intense femtosecond laser pulses

Kim, JH; Lee, DG; Nam, Chang Hee, 4th Pacific Rim Conference on Lasers and Electro-Optics, CLEO, 2001-07-15

198390
Full characterization of third harmonic generation in CsLiB6O10 (CLBO) crystals

Kim, MS; Yoon, Choon Sup, 4th Pacific Rim Conference on Lasers and Electro-Optics, pp.II 398 - II 399, CLEO, 2001-07-15

198391
Atomic wave packet dynamics in a standing wave quantum field

Chough Y.-T.; Nha H.; An K., 4th Pacific Rim Conference on Lasers and Electro-Optics, CLEO, 2001-07-15

198392
Ultrahigh-Q microsphere laser based on the evanescent-wave-coupled gain

Choi Y.-S.; Moon H.-J.; An K., 4th Pacific Rim Conference on Lasers and Electro-Optics, CLEO, 2001-07-15

198393
Optimization of a network with Gaussian kernel functions based on the estimation of error confidence intervals

Kil, Rhee Man; Koo I., International Joint Conference on Neural Networks (IJCNN'01), pp.1762 - 1766, IJCNN, 2001-07-15

198394
Robust design of artificial neural network for roll force prediction in hot strip mill

Kim, YS; Yum, Bong-Jin; Kim, M, International Joint Conference on Neural Networks (IJCNN'01), pp.2800 - 2804, IJCNN, 2001-07-15

198395
A self-referencing level-set method for image reconstruction from sparse Fourier samples

Ye, Jong Chul; Bresler, Y; Moulin, P, IEEE Workshop on variational and level set methods in computer vision 2001, 2001-07-13

198396
A Time and Frequency Offset Estimation Scheme for OFDM Systems by Using an Analytic Tone

Kim, D; Park, Hyuncheol, International Technical Conferences on Circuit/Systems, Computer and Communications (ITC-CSCC 2001), pp.0 - 0, IEICE, IEEK, ECTI, 2001-07-10

198397
Adaptive Sectorization System Employing Interference Cancellation

Yu, B; Park, Hyuncheol; Ko, H, International Technical Conferences on Circuit/Systems, Computer and Communications (ITC-CSCC 2001), IEICE, IEEK, ECTI, 2001-07-10

198398
Polymer using norbornene monomers with derivatives of cholic acid, deoxycholic acid or lithocholic acid and use thereof

김진백, 2001-07-10

198399
Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides

Cho, Byung Jin; Loh, WY; Li, MF; Xu, Z, 8th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp.59 - 59, 2001-07-09

198400
Effect of electron-beam lithography on thin gate oxide reliability

Cho, Byung Jin; Chong, PF; Chor, EF; Joo, MS, 8th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp.55 - 55, 2001-07-09

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