Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxidesBipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides
- Issue Date
- 2001-07-09
- Language
- ENG
- Citation
8th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp.59 - 59
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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