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1
A study on device characteristics of non-volatile memory with Ge doped Sb-Te phase change materials = Ge 첨가된 Sb-Te계 상변화 재료를 이용한 비휘발성 메모리 소자의 특성에 관한 연구link

Zhe Wu; Wu, Zhe; et al, 한국과학기술원, 2011

2
A transmission electron microscopy study on the microstructural properties of Te-based chalcogenide thin films = Te 계 칼코게나이드 박막의 미세구조 특성에 관한 투과전자현미경 연구link

Sun, Chang-Woo; 선창우; et al, 한국과학기술원, 2010

3
Atomic force microscope 를 이용한 $Ge_2Sb_2Te_5$ 박막의 상변화 거동 및 전기적 특성평가 = The estimation of the phase change behavior and electrical property of $Ge_2Sb_2Te_5$ thin films using atomic force microscopelink

노기민; Roh, Ki-Min; et al, 한국과학기술원, 2005

4
Characterization of Ag-x(Ge2Sb2Te5)(1-x) thin film by RF magnetron sputtering

Kim, Dong Hun; Kim, Myung Sun; Kim, Ran-Young; Kim, Kyung Sun; Kim, Ho Gi, MATERIALS CHARACTERIZATION, v.58, no.5, pp.479 - 484, 2007

5
Fabrication and characteristics of phase change memory based on block copolymer lithography = 블록공중합체 리소그래피를 이용한 상변화 메모리의 제작 및 특성분석link

Yoon, Jong-Moon; 윤종문; et al, 한국과학기술원, 2012

6
Flexible Crossbar-Structured Phase Change Memory Array via Mo-Based Interfacial Physical Lift-Off

Kim, Do Hyun; Lee, Han Eol; You, Byoung Kuk; Cho, Sung Beom; Mishra, Rohan; Kang, Il-Suk; Lee, Keon Jae, ADVANCED FUNCTIONAL MATERIALS, v.29, no.6, 2019-02

7
Flexible One Diode-One Phase Change Memory Array Enabled by Block Copolymer Self-Assembly

Mun, Beomho; You, Byoungkuk; Yang, Se Ryeun; Yoo, Hyeon Gyun; Kim, JongMin; Park, Woon-Ik; Yin, You; et al, ACS NANO, v.9, no.4, pp.4120 - 4128, 2015-04

8
Preparation and observation of an artifact-free Ge2Sb2Te5 TEM specimen by the small angle cleavage technique

Kim, MS; Kim, Ho Gi, MATERIALS CHARACTERIZATION, v.56, no.3, pp.245 - 249, 2006-04

9
Recent Advances and Future Prospects for Memristive Materials, Devices, and Systems

Song, Min-Kyu; Kang, Ji-Hoon; Zhang, Xinyuan; Ji, Wonjae; Ascoli, Alon; Messaris, Ioannis; Demirkol, Ahmet Samil; et al, ACS NANO, v.17, no.13, pp.11994 - 12039, 2023-07

10
Self-Assembled Incorporation of Modulated Block Copolymer Nanostructures in Phase-Change Memory for Switching Power Reduction

Park, Woon-Ik; You, Byoung-Kuk; Mun, Beom-Ho; Seo, Hyeon Kook; Lee, Jeong-Yong; Hosaka, Sumio; Yin, You; et al, ACS NANO, v.7, no.3, pp.2651 - 2658, 2013-03

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