Browse by Type Article
Showing results 70641 to 70660 of 100108
| Scanning Hall probe measurements of field distributions of a coated conductor under applied fields Yoo, J; Jung, YW; Lee, J; Lim, S; Lee, S; Jung, YH; Youm, Do-Jun; et al, SUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.19, pp.1291 - 1296, 2006-12 |
Scanning MEMS Mirror for High Definition and High Frame Rate Lissajous Patterns Seo, Yeong-Hyeon; Hwang, Kyungmin; Kim, Hyunwoo; Jeong, Ki-Hun, MICROMACHINES, v.10, no.1, 2019-01 |
| Scanning Photoemission Microscopy of Graphene Sheets on SiO2 Kim, Ki-Jeong; Lee, Hangil; Choi, Jae-Hyun; Youn, Young-Sang; Choi, Jung-Hun; Lee, Han-Koo; Kang, Tai-Hee; et al, ADVANCED MATERIALS, v.20, no.19, pp.3589 - 3589, 2008-10 |
| Scanning probe-type data storage beyond hard disk drive and flash memory Cho, Yasuo; Hong, Seungbum, MRS BULLETIN, v.43, no.5, pp.365 - 370, 2018-05 |
| Scanning resistive probe microscopy: Imaging ferroelectric domains Park, H; Jung, J; Min, DK; Kim, S; Hong, S; Shin, H, APPLIED PHYSICS LETTERS, v.84, no.10, pp.1734 - 1736, 2004-03 |
| Scanning transmission X-ray microscopy probe for in situ mechanism study of graphene-oxide-based resistive random access memory Nho, Hyun Woo; Kim, Jong Yun; Wang, Jian; Shin, Hyun-Joon; Choi, Sung-Yool; Yoon, Tae Hyun, JOURNAL OF SYNCHROTRON RADIATION, v.21, pp.170 - 176, 2014-01 |
| SCANNING TUNNELING MICROSCOPE WITH NOVEL COARSE SAMPLE POSITIONING TECHNIQUE PARK, C; PARK, KS; HUH, YS; JEON, IC; Kim, Sehun, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.9, no.2, pp.636 - 638, 1991 |
| Scanning tunneling microscopy investigation of silver deposition upon Au(111) in the presence of chloride Lee, J; Oh, I; Hwang, S; Kwak, Juhyoun, LANGMUIR, v.18, no.21, pp.8025 - 8032, 2002-10 |
| Scanning tunneling microscopy of template-stripped Au surfaces and highly ordered self-assembled monolayers Lee, S; Bae, Sung-Soo; Medeiros-Ribeiro, G; Blackstock, JJ; Kim, Sehun; Stewart, DR; Ragan, R, LANGMUIR, v.24, no.12, pp.5984 - 5987, 2008-06 |
| Scanning tunneling microscopy study on c(4 x 4) structure of Si(100) Maeng, JY; Kim, Sehun, SURFACE SCIENCE, v.482, pp.1445 - 1450, 2001-06 |
| Scanning tunneling microscopy under chemical reaction at solid-liquid and solid-gas interfaces Kim, Yongman; Kim, Young Jae; Park, Jeong Young, CHEMICAL PHYSICS REVIEWS, v.4, no.3, 2023-09 |
| Scanning tunneling spectroscopy of a semiconducting heterojunction nanotube on the Au(111) surface Kim, H; Lee, Jhinhwan; Lee, S; Song, YJ; Choi, BY; Kuk, Y; Kahng, SJ, SURFACE SCIENCE, v.581, pp.241 - 245, 2005-05 |
| Scanning tunneling spectroscopy of field-induced Au nanodots on ultrathin oxides on Si(100) Park, JY; Phaneuf, RJ; Williams, ED, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.19, no.2, pp.523 - 526, 2001 |
| SCARA 형 D.D. 로보트를 위한 복합재료 팔의 최적 Winding 각도 계산 이대길; 김기수; 임창영; 곽윤근, 한국복합재료학회지, v.1, no.1, pp.43 - 49, 1988 |
| Scarless chromosomal gene knockout methods Sung, Bong-Hyun; Lee, Jun-Hyoung; Kim, Sun-Chang, Methods in Molecular Biology, v.765, no.0, pp.43 - 54, 2011 |
| Scattered Classes of Graphs Kwon, O-joung; Oum, Sang-il, SIAM JOURNAL ON DISCRETE MATHEMATICS, v.34, no.1, pp.972 - 999, 2020-01 |
| Scattered data interpolation with multilevel B-splines Lee, S; Wolberg, G; Shin, Sung-Yong, IEEE TRANSACTIONS ON VISUALIZATION AND COMPUTER GRAPHICS, v.3, no.3, pp.228 - 244, 1997 |
| SCATTERED ELECTRON COUNTING SYSTEM FOR NOZZLE BEAM STUDIES OF SMALL CLUSTERS Kim, Sang Soo; STEIN, GD, REVIEW OF SCIENTIFIC INSTRUMENTS, v.53, no.6, pp.838 - 844, 1982 |
| Scattered neutron calibration fields of KAERI Cho, Gyuseong; Kim, B.H.; Kim, J.L.; Chang , S.Y., JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, v.37, no.1, pp.781 - 784, 2000 |
| Scattering amplitudes for monopoles: pairwise little group and pairwise helicity Csaki, Csaba; Hong, Sungwoo; Shirman, Yuri; Telem, Ofri; Terning, John; Waterbury, Michael, JOURNAL OF HIGH ENERGY PHYSICS, no.8, 2021-08 |
Discover
Type
Open Access
Date issued
- 31,142 2020 - 2024
- 99,968 2010 - 2019
- 75,670 2000 - 2009
- 44,727 1990 - 1999
- 14,360 1980 - 1989
- 62 1964 - 1969