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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Formation mechanism of crystallites in the as-deposited mixed-phase low pressure chemical vapor deposition silicon thin films Kim, JH; Lee, JeongYong; Nam, KS, JOURNAL OF APPLIED PHYSICS, v.79, no.3, pp.1794 - 1800, 1996-02 | |
| Effect of deposition temperature on the crystallization mechanism of amorphous silicon films on glass Lee, JN; Lee, BJ; Moon, DG; Ahn, Byung Tae, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.36, no.11, pp.6862 - 6866, 1997-11 | |
| Development of a fatigue testing system for thin films Kim, Chung-Youb; Song, Ji-Ho; Lee, Do-Young, INTERNATIONAL JOURNAL OF FATIGUE, v.31, no.4, pp.736 - 742, 2009 | |
| Resistivity dependence of gauge factor of polysilicon strain gauge Kim, Yongdae; Kwon, Sejin, MICRO & NANO LETTERS, v.5, no.3, pp.189 - 192, 2010-06 | |
| Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon Zeng, YP; Lu, YF; Shen, ZX; Sun, WX; Yu, T; Liu, L; Zeng, JN; Cho, Byung Jin; Poon, CH, NANOTECHNOLOGY, v.15, no.5, pp.658 - 662, 2004-05 | |
| Thin film transistors fabricated with poly-Si films crystallized by microwave annealing Choi, YW; Lee, JN; Jang, TW; Ahn, Byung Tae, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.33, pp.411 - 414, 1998-11 | |
| High-resolution transmission electron microscopy study of pulsed laser beam crystallized Si thin film: The formation of hexagonal Si and defects Kim, JH; Lee, JeongYong, THIN SOLID FILMS, v.292, no.1-2, pp.313 - 317, 1997-01 | |
| HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY OF SOLID-PHASE CRYSTALLIZED SILICON THIN-FILMS ON SIO2 - CRYSTAL-GROWTH AND DEFECTS FORMATION KIM, JH; Lee, JeongYong; NAM, KS, JOURNAL OF APPLIED PHYSICS, v.77, no.1, pp.95 - 102, 1995-01 | |
| SUPPRESSION OF LEAKAGE CURRENT IN N-CHANNEL POLYSILICON THIN-FILM TRANSISTORS USING NH3 ANNEALING CHOI, DS; HUR, SH; YANG, GY; Han, Chul-Hi; Kim, Choong Ki, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.34, no.2B, pp.882 - 885, 1995-02 | |
| Field emission characteristics of CoSi2/TiN-coated silicon emitter tips Han, BW; Lee, HS; Ahn, Byung Tae, APPLIED SURFACE SCIENCE, v.187, no.1-2, pp.45 - 50, 2002-02 |
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