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Kim, Heeyoung (김희영)
부교수, (산업및시스템공학과)

http://istat.kaist.ac.kr/

Research Area
Applied Statistics, Machine Learning , Data Science
Co-researchers
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    NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
    1
    Prediction of Highly Imbalanced Semiconductor Chip-Level Defects in Module Tests Using Multimodal Fusion and Logit Adjustment

    Cho, Hunsung; Koo, Wonmo; Kim, Heeyoungresearcher, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.3, pp.425 - 433, 2023-08

    2
    Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps

    Lee, Hyuck; Lee, Jaehyun; Kim, Heeyoungresearcher, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.220 - 230, 2023-05

    3
    Deep embedding kernel mixture networks for conditional anomaly detection in high-dimensional data

    Kim, Hyojoong; Kim, Heeyoungresearcher, INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, v.61, no.4, pp.1101 - 1113, 2023-03

    4
    Toward Data-Driven Digital Therapeutics Analytics: Literature Review and Research Directions

    Lee, Uichinresearcher; Jung, Gyuwon; Ma, Eun-Yeol; et al, IEEE-CAA JOURNAL OF AUTOMATICA SINICA, v.10, no.1, pp.42 - 66, 2023-01

    5
    Label-Noise Robust Deep Generative Model for Semi-Supervised Learning

    Yoon, Heegeon; Kim, Heeyoungresearcher, TECHNOMETRICS, v.65, no.1, pp.83 - 95, 2023-01

    6
    Contextual anomaly detection for high-dimensional data using Dirichlet process variational autoencoder

    Kim, Hyojoong; Kim, Heeyoungresearcher, IISE TRANSACTIONS, v.55, no.5, pp.433 - 444, 2023-01

    7
    Prediction of highly imbalanced semiconductor chip-level defects using uncertainty-based adaptive margin learning

    Park, Sumin; Kim, Keunseo; Kim, Heeyoungresearcher, IISE TRANSACTIONS, v.55, no.2, pp.147 - 155, 2022-11

    8
    Deep Gaussian process models for integrating multifidelity experiments with nonstationary relationships

    Ko, Jongwoo; Kim, Heeyoungresearcher, IISE TRANSACTIONS, v.54, no.7, pp.686 - 698, 2022-07

    9
    Toward Robust Battle Experimental Design for Command and Control of Mechanized Infantry Brigade

    Yun, Woo-Seop; Ko, Sunggil; Byun, Muhyun; et al, MILITARY OPERATIONS RESEARCH, v.27, no.1, pp.45 - 72, 2022-05

    10
    Simultaneous band selection and segmentation of hyperspectral images via a mixture of finite maximum margin mixtures

    Doo, Woojin; Kim, Heeyoungresearcher, INTERNATIONAL JOURNAL OF REMOTE SENSING, v.43, no.6, pp.2296 - 2314, 2022-03

    11
    Bayesian variable selection in clustering high-dimensional data via a mixture of finite mixtures

    Doo, Woojin; Kim, Heeyoungresearcher, JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION, v.91, no.12, pp.2551 - 2568, 2021-08

    12
    Robust estimation of sparse precision matrix using adaptive weighted graphical lasso approach

    Tang, Peng; Jiang, Huijing; Kim, Heeyoungresearcher; et al, JOURNAL OF NONPARAMETRIC STATISTICS, v.33, no.2, pp.249 - 272, 2021-04

    13
    Combined unsupervised-supervised machine learning for phenotyping complex diseases with its application to obstructive sleep apnea

    Ma, Eun-Yeol; Kim, Jeong-Whun; Lee, Youngmin; et al, SCIENTIFIC REPORTS, v.11, no.1, 2021-02

    14
    Bayesian nonparametric latent class model for longitudinal data

    Koo, Wonmo; Kim, Heeyoungresearcher, STATISTICAL METHODS IN MEDICAL RESEARCH, v.29, no.11, pp.3381 - 3395, 2020-11

    15
    Memory-Augmented Convolutional Neural Networks With Triplet Loss for Imbalanced Wafer Defect Pattern Classification

    Hyun, Yunseung; Kim, Heeyoungresearcher, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.622 - 634, 2020-11

    16
    Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns

    Lee, Hyuck; Kim, Heeyoungresearcher, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11

    17
    Multiresolution spatial generalized linear mixed model for integrating multi-fidelity spatial count data without common identifiers between data sources

    Kim, Sungil; Duan, Rong; Ma, Guang-Qin; et al, SPATIAL STATISTICS, v.39, 2020-10

    18
    Variational Deep Clustering of Wafer Map Patterns

    Hwang, Jonghyun; Kim, Heeyoungresearcher, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.3, pp.466 - 475, 2020-08

    19
    Bayesian Nonparametric Joint Mixture Model for Clustering Spatially Correlated Time Series

    Lee, Youngmin; Kim, Heeyoungresearcher, TECHNOMETRICS, v.62, no.3, pp.313 - 329, 2020-07

    20
    Fault Classification in High-Dimensional Complex Processes Using Semi-Supervised Deep Convolutional Generative Models

    Ko, Taeyoung; Kim, Heeyoungresearcher, IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, v.16, no.4, pp.2868 - 2877, 2020-04
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