A multi-step electrochemical etching process for a three-dimensional micro probe array

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dc.contributor.authorKim, Yoon-Jiko
dc.contributor.authorYoun, Se-Chanko
dc.contributor.authorCho, Young-Hoko
dc.contributor.authorPark, Ho-Joonko
dc.contributor.authorChang, Byeung-Gyuko
dc.contributor.authorOh, Yong-Sooko
dc.date.accessioned2013-03-11T18:51:02Z-
dc.date.available2013-03-11T18:51:02Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2011-01-
dc.identifier.citationJOURNAL OF MICROMECHANICS AND MICROENGINEERING, v.21, no.1-
dc.identifier.issn0960-1317-
dc.identifier.urihttp://hdl.handle.net/10203/99976-
dc.description.abstractWe present a simple, fast, and cost-effective process for three-dimensional (3D) micro probe array fabrication using multi-step electrochemical metal foil etching. Compared to the previous electroplating (add-on) process, the present electrochemical (subtractive) process results in well-controlled material properties of the metallic microstructures. In the experimental study, we describe the single-step and multi-step electrochemical aluminum foil etching processes. In the single-step process, the depth etch rate and the bias etch rate of an aluminum foil have been measured as 1.50 +/- 0.10 and 0.77 +/- 0.03 mu m min(-1), respectively. On the basis of the single-step process results, we have designed and performed the two-step electrochemical etching process for the 3D micro probe array fabrication. The fabricated 3D micro probe array shows the vertical and lateral fabrication errors of 15.5 +/- 5.8% and 3.3 +/- 0.9%, respectively, with the surface roughness of 37.4 +/- 9.6 nm. The contact force and the contact resistance of the 3D micro probe array have been measured to be 24.30 +/- 0.98 mN and 2.27 +/- 0.11 Omega, respectively, for an overdrive of 49.12 +/- 1.25 mu m.-
dc.languageEnglish-
dc.publisherIOP PUBLISHING LTD-
dc.subjectFABRICATION METHOD-
dc.subjectMICROFABRICATION-
dc.subjectMICROSTRUCTURES-
dc.subjectWAFER-
dc.subjectCARD-
dc.titleA multi-step electrochemical etching process for a three-dimensional micro probe array-
dc.typeArticle-
dc.identifier.wosid000285547800019-
dc.identifier.scopusid2-s2.0-78651494058-
dc.type.rimsART-
dc.citation.volume21-
dc.citation.issue1-
dc.citation.publicationnameJOURNAL OF MICROMECHANICS AND MICROENGINEERING-
dc.identifier.doi10.1088/0960-1317/21/1/015019-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorCho, Young-Ho-
dc.contributor.nonIdAuthorKim, Yoon-Ji-
dc.contributor.nonIdAuthorPark, Ho-Joon-
dc.contributor.nonIdAuthorChang, Byeung-Gyu-
dc.contributor.nonIdAuthorOh, Yong-Soo-
dc.type.journalArticleArticle-
dc.subject.keywordPlusFABRICATION METHOD-
dc.subject.keywordPlusMICROFABRICATION-
dc.subject.keywordPlusMICROSTRUCTURES-
dc.subject.keywordPlusWAFER-
dc.subject.keywordPlusCARD-
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