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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Reflection electron energy loss spectroscopy of nanometric oxide layers and of their interfaces with a substrate Paumier, F; Fouquet, V; Guittet, MJ; Gautier-Soyer, M; French, RH; Tan, GL; Chiang, YM; Tang, M; Ramos, A; Chung, Sung-Yoon, MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v.422, no.1-2, pp.29 - 40, 2006-04 |
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