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Reflection electron energy loss spectroscopy of nanometric oxide layers and of their interfaces with a substrate

Paumier, F; Fouquet, V; Guittet, MJ; Gautier-Soyer, M; French, RH; Tan, GL; Chiang, YM; et al, MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v.422, no.1-2, pp.29 - 40, 2006-04

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