Browse "EEW-Journal Papers(저널논문)" by Subject In-situ transmission electron microscopy

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FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior

Lee, Subin; Jeong, Jiwon; Kim, You Bin; Han, Seung Min J.; Kiener, Daniel; Oh, Sang Ho, ACTA MATERIALIA, v.110, pp.283 - 294, 2016-05

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