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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Electrical Transport Properties of Graphene Layer under Strain Probed by Atomic Force Microscopy Kwon, S.; Choi, S.; Chung, H.J.; Seo, S.; Park, JeongYoung, ALC 11(8th International Symposium on Atomic Level Characterizations for New Materials and Devices ’11), 2011-05-27 | |
| Charge Tranport Properties of Graphene under Strain Probed with Atomic Force Microscopy Kwon, S. K.; Choi, S.; Chung, H.; Seo, S.; Park, JeongYoung, 2011 MRS Spring Meeting, 2011-04-26 |
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