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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Electrical Characterization of Nanoscale Au/TiO2 Schottky Diodes Probed with Conductive Atomic Force Microscopy 이현수; Lee, Young keun; Bae, Saebyuk; 박정영, 한국물리학회 2014년 봄 학술논문발표회 및 정기총회, 한국물리학회, 2014-04-24 |
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