Browse "EEW-Conference Papers(학술회의논문)" by Author Choi, S.
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| Electrical Transport Properties of Graphene Layer under Strain Probed by Atomic Force Microscopy Kwon, S.; Choi, S.; Chung, H.J.; Seo, S.; Park, JeongYoung, ALC 11(8th International Symposium on Atomic Level Characterizations for New Materials and Devices ’11), 2011-05-27 |
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- 755 Conference
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- 739 2010 - 2019
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