DC Field | Value | Language |
---|---|---|
dc.contributor.author | Il Ahn, Sung | ko |
dc.contributor.author | Lee, Seong Eui | ko |
dc.contributor.author | Ryu, Si Hong | ko |
dc.contributor.author | Choi, Kyung Cheol | ko |
dc.contributor.author | Kwon, Sang Jik | ko |
dc.contributor.author | Uchiike, Heiju | ko |
dc.date.accessioned | 2013-03-11T05:37:20Z | - |
dc.date.available | 2013-03-11T05:37:20Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2009-01 | - |
dc.identifier.citation | THIN SOLID FILMS, v.517, no.5, pp.1706 - 1709 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | http://hdl.handle.net/10203/98399 | - |
dc.description.abstract | Using a sot-gel precursor, Na-ion-doped MgO was prepared and applied to alternative current plasma display panels (ac-PDP). The cathodoluminescence spectra showed that the F(+) center was increased as the concentration of Na(+) was increased. Numerous pores were found on the printed MgO surface and seemed to give higher memory margin of ac-PDP compared to an electron beam-evaporated MgO film. All doped MgO showed higher secondary electron emission than printed pure MgO, likely owing to the O defect states of MgO. In addition, this result indicated the operational memory margin of the ac-PDP was directly proportional to the grade of surface charging. (C) 2008 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.subject | PROTECTIVE LAYER | - |
dc.subject | YIELD | - |
dc.subject | GAMMA | - |
dc.title | A study on the secondary electron emission from Na-ion-doped MgO films in relation to the discharge characteristics of plasma display panels | - |
dc.type | Article | - |
dc.identifier.wosid | 000262346900035 | - |
dc.identifier.scopusid | 2-s2.0-56949083066 | - |
dc.type.rims | ART | - |
dc.citation.volume | 517 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 1706 | - |
dc.citation.endingpage | 1709 | - |
dc.citation.publicationname | THIN SOLID FILMS | - |
dc.identifier.doi | 10.1016/j.tsf.2008.08.176 | - |
dc.contributor.localauthor | Choi, Kyung Cheol | - |
dc.contributor.nonIdAuthor | Il Ahn, Sung | - |
dc.contributor.nonIdAuthor | Lee, Seong Eui | - |
dc.contributor.nonIdAuthor | Ryu, Si Hong | - |
dc.contributor.nonIdAuthor | Uchiike, Heiju | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | ac-PDP | - |
dc.subject.keywordAuthor | Mgo | - |
dc.subject.keywordAuthor | Na-ion-doping | - |
dc.subject.keywordAuthor | Secondary electron emission | - |
dc.subject.keywordAuthor | Porous film | - |
dc.subject.keywordAuthor | Cathodoluminescence | - |
dc.subject.keywordAuthor | X-ray diffraction | - |
dc.subject.keywordAuthor | Scanning electron microscopy | - |
dc.subject.keywordPlus | PROTECTIVE LAYER | - |
dc.subject.keywordPlus | YIELD | - |
dc.subject.keywordPlus | GAMMA | - |
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