A study on the secondary electron emission from Na-ion-doped MgO films in relation to the discharge characteristics of plasma display panels

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dc.contributor.authorIl Ahn, Sungko
dc.contributor.authorLee, Seong Euiko
dc.contributor.authorRyu, Si Hongko
dc.contributor.authorChoi, Kyung Cheolko
dc.contributor.authorKwon, Sang Jikko
dc.contributor.authorUchiike, Heijuko
dc.date.accessioned2013-03-11T05:37:20Z-
dc.date.available2013-03-11T05:37:20Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2009-01-
dc.identifier.citationTHIN SOLID FILMS, v.517, no.5, pp.1706 - 1709-
dc.identifier.issn0040-6090-
dc.identifier.urihttp://hdl.handle.net/10203/98399-
dc.description.abstractUsing a sot-gel precursor, Na-ion-doped MgO was prepared and applied to alternative current plasma display panels (ac-PDP). The cathodoluminescence spectra showed that the F(+) center was increased as the concentration of Na(+) was increased. Numerous pores were found on the printed MgO surface and seemed to give higher memory margin of ac-PDP compared to an electron beam-evaporated MgO film. All doped MgO showed higher secondary electron emission than printed pure MgO, likely owing to the O defect states of MgO. In addition, this result indicated the operational memory margin of the ac-PDP was directly proportional to the grade of surface charging. (C) 2008 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE SA-
dc.subjectPROTECTIVE LAYER-
dc.subjectYIELD-
dc.subjectGAMMA-
dc.titleA study on the secondary electron emission from Na-ion-doped MgO films in relation to the discharge characteristics of plasma display panels-
dc.typeArticle-
dc.identifier.wosid000262346900035-
dc.identifier.scopusid2-s2.0-56949083066-
dc.type.rimsART-
dc.citation.volume517-
dc.citation.issue5-
dc.citation.beginningpage1706-
dc.citation.endingpage1709-
dc.citation.publicationnameTHIN SOLID FILMS-
dc.identifier.doi10.1016/j.tsf.2008.08.176-
dc.contributor.localauthorChoi, Kyung Cheol-
dc.contributor.nonIdAuthorIl Ahn, Sung-
dc.contributor.nonIdAuthorLee, Seong Eui-
dc.contributor.nonIdAuthorRyu, Si Hong-
dc.contributor.nonIdAuthorUchiike, Heiju-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorac-PDP-
dc.subject.keywordAuthorMgo-
dc.subject.keywordAuthorNa-ion-doping-
dc.subject.keywordAuthorSecondary electron emission-
dc.subject.keywordAuthorPorous film-
dc.subject.keywordAuthorCathodoluminescence-
dc.subject.keywordAuthorX-ray diffraction-
dc.subject.keywordAuthorScanning electron microscopy-
dc.subject.keywordPlusPROTECTIVE LAYER-
dc.subject.keywordPlusYIELD-
dc.subject.keywordPlusGAMMA-
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