Electrical transport and mechanical properties of alkylsilane self-assembled monolayers on silicon surfaces probed by atomic force microscopy

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dc.contributor.authorPark, JeongYoungko
dc.contributor.authorQi, YBko
dc.contributor.authorAshby, PDko
dc.contributor.authorHendriksen, BLMko
dc.contributor.authorSalmeron, Mko
dc.date.accessioned2013-03-09T21:50:39Z-
dc.date.available2013-03-09T21:50:39Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2009-03-
dc.identifier.citationJOURNAL OF CHEMICAL PHYSICS, v.130, no.11-
dc.identifier.issn0021-9606-
dc.identifier.urihttp://hdl.handle.net/10203/97563-
dc.description.abstractThe correlation between molecular conductivity and mechanical properties (molecular deformation and frictional responses) of hexadecylsilane self-assembled monolayers was studied with conductive probe atomic force microscopy/friction force microscopy in ultrahigh vacuum. Current and friction were measured as a function of applied pressure, simultaneously, while imaging the topography of self-assembled monolayer molecule islands and silicon surfaces covered with a thin oxide layer. Friction images reveal lower friction over the molecules forming islands than over the bare silicon surface, indicating the lubricating functionality of alkylsilane molecules. By measuring the tunneling current change due to changing of the height of the molecular islands by tilting the molecules under pressure from the tip, we obtained an effective conductance decay constant (beta) of 0.52/A.-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.subjectOCTADECYLTRICHLOROSILANE MONOLAYERS-
dc.subjectELECTRONIC TRANSPORT-
dc.subjectORGANIC-MOLECULES-
dc.subjectALKYL MONOLAYERS-
dc.subjectCHAIN-LENGTH-
dc.subjectFRICTION-
dc.subjectFILMS-
dc.subjectCALIBRATION-
dc.subjectJUNCTIONS-
dc.subjectADHESION-
dc.titleElectrical transport and mechanical properties of alkylsilane self-assembled monolayers on silicon surfaces probed by atomic force microscopy-
dc.typeArticle-
dc.identifier.wosid000264380400031-
dc.identifier.scopusid2-s2.0-63149171235-
dc.type.rimsART-
dc.citation.volume130-
dc.citation.issue11-
dc.citation.publicationnameJOURNAL OF CHEMICAL PHYSICS-
dc.identifier.doi10.1063/1.3089789-
dc.contributor.localauthorPark, JeongYoung-
dc.contributor.nonIdAuthorQi, YB-
dc.contributor.nonIdAuthorAshby, PD-
dc.contributor.nonIdAuthorHendriksen, BLM-
dc.contributor.nonIdAuthorSalmeron, M-
dc.type.journalArticleArticle-
dc.subject.keywordAuthoratomic force microscopy-
dc.subject.keywordAuthordeformation-
dc.subject.keywordAuthorelemental semiconductors-
dc.subject.keywordAuthorfriction-
dc.subject.keywordAuthorisland structure-
dc.subject.keywordAuthormonolayers-
dc.subject.keywordAuthororganic compounds-
dc.subject.keywordAuthorself-assembly-
dc.subject.keywordAuthorsilicon-
dc.subject.keywordAuthorsurface conductivity-
dc.subject.keywordAuthorsurface topography-
dc.subject.keywordPlusOCTADECYLTRICHLOROSILANE MONOLAYERS-
dc.subject.keywordPlusELECTRONIC TRANSPORT-
dc.subject.keywordPlusORGANIC-MOLECULES-
dc.subject.keywordPlusALKYL MONOLAYERS-
dc.subject.keywordPlusCHAIN-LENGTH-
dc.subject.keywordPlusFRICTION-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusCALIBRATION-
dc.subject.keywordPlusJUNCTIONS-
dc.subject.keywordPlusADHESION-
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