DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, JeongYoung | ko |
dc.contributor.author | Qi, YB | ko |
dc.contributor.author | Ashby, PD | ko |
dc.contributor.author | Hendriksen, BLM | ko |
dc.contributor.author | Salmeron, M | ko |
dc.date.accessioned | 2013-03-09T21:50:39Z | - |
dc.date.available | 2013-03-09T21:50:39Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2009-03 | - |
dc.identifier.citation | JOURNAL OF CHEMICAL PHYSICS, v.130, no.11 | - |
dc.identifier.issn | 0021-9606 | - |
dc.identifier.uri | http://hdl.handle.net/10203/97563 | - |
dc.description.abstract | The correlation between molecular conductivity and mechanical properties (molecular deformation and frictional responses) of hexadecylsilane self-assembled monolayers was studied with conductive probe atomic force microscopy/friction force microscopy in ultrahigh vacuum. Current and friction were measured as a function of applied pressure, simultaneously, while imaging the topography of self-assembled monolayer molecule islands and silicon surfaces covered with a thin oxide layer. Friction images reveal lower friction over the molecules forming islands than over the bare silicon surface, indicating the lubricating functionality of alkylsilane molecules. By measuring the tunneling current change due to changing of the height of the molecular islands by tilting the molecules under pressure from the tip, we obtained an effective conductance decay constant (beta) of 0.52/A. | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | OCTADECYLTRICHLOROSILANE MONOLAYERS | - |
dc.subject | ELECTRONIC TRANSPORT | - |
dc.subject | ORGANIC-MOLECULES | - |
dc.subject | ALKYL MONOLAYERS | - |
dc.subject | CHAIN-LENGTH | - |
dc.subject | FRICTION | - |
dc.subject | FILMS | - |
dc.subject | CALIBRATION | - |
dc.subject | JUNCTIONS | - |
dc.subject | ADHESION | - |
dc.title | Electrical transport and mechanical properties of alkylsilane self-assembled monolayers on silicon surfaces probed by atomic force microscopy | - |
dc.type | Article | - |
dc.identifier.wosid | 000264380400031 | - |
dc.identifier.scopusid | 2-s2.0-63149171235 | - |
dc.type.rims | ART | - |
dc.citation.volume | 130 | - |
dc.citation.issue | 11 | - |
dc.citation.publicationname | JOURNAL OF CHEMICAL PHYSICS | - |
dc.identifier.doi | 10.1063/1.3089789 | - |
dc.contributor.localauthor | Park, JeongYoung | - |
dc.contributor.nonIdAuthor | Qi, YB | - |
dc.contributor.nonIdAuthor | Ashby, PD | - |
dc.contributor.nonIdAuthor | Hendriksen, BLM | - |
dc.contributor.nonIdAuthor | Salmeron, M | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | atomic force microscopy | - |
dc.subject.keywordAuthor | deformation | - |
dc.subject.keywordAuthor | elemental semiconductors | - |
dc.subject.keywordAuthor | friction | - |
dc.subject.keywordAuthor | island structure | - |
dc.subject.keywordAuthor | monolayers | - |
dc.subject.keywordAuthor | organic compounds | - |
dc.subject.keywordAuthor | self-assembly | - |
dc.subject.keywordAuthor | silicon | - |
dc.subject.keywordAuthor | surface conductivity | - |
dc.subject.keywordAuthor | surface topography | - |
dc.subject.keywordPlus | OCTADECYLTRICHLOROSILANE MONOLAYERS | - |
dc.subject.keywordPlus | ELECTRONIC TRANSPORT | - |
dc.subject.keywordPlus | ORGANIC-MOLECULES | - |
dc.subject.keywordPlus | ALKYL MONOLAYERS | - |
dc.subject.keywordPlus | CHAIN-LENGTH | - |
dc.subject.keywordPlus | FRICTION | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordPlus | CALIBRATION | - |
dc.subject.keywordPlus | JUNCTIONS | - |
dc.subject.keywordPlus | ADHESION | - |
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