Metal-oxide-semiconductor field effect transistor humidity sensor using surface conductance

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This letter presents a metal-oxide-semiconductor field effect transistor based humidity sensor which does not use any specific materials to sense the relative humidity. We simply make use of the low pressure chemical vapor deposited (LPCVD) silicon dioxide's surface conductance change. When the gate is biased and then floated, the electrical charge in the gate is dissipated through the LPCVD silicon dioxide's surface to the surrounding ground with a time constant depending on the surface conductance which, in turn, varies with humidity. With this method, extremely high sensitivity was achieved-the charge dissipation speed increased thousand times as the relative humidity increased. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3691936]
Publisher
AMER INST PHYSICS
Issue Date
2012-03
Language
English
Article Type
Article
Keywords

THIN-FILM TRANSISTORS; GATE FET; CMOS

Citation

APPLIED PHYSICS LETTERS, v.100, no.10

ISSN
0003-6951
DOI
10.1063/1.3691936
URI
http://hdl.handle.net/10203/96395
Appears in Collection
EE-Journal Papers(저널논문)
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