A new HRSEM approach to observe fine structures of novel nanostructured materials
A new approach for observing fine structures of novel thin, nanostructured materials called through the lens system (TTLS) is employed to observe interesting features on a variety of new, catalytically-important, hierarchically porous rattlespheres. (C) 2011 Elsevier Inc. All rights reserved.
- Publisher
- ELSEVIER SCIENCE BV
- Issue Date
- 2011-12
- Language
- English
- Article Type
- Article
- Keywords
SCANNING-ELECTRON-MICROSCOPY; BACKSCATTERING COEFFICIENT; ENERGY; BEAMS; SEM
- Citation
MICROPOROUS AND MESOPOROUS MATERIALS, v.146, no.1-3, pp.11 - 17
- ISSN
- 1387-1811
- Appears in Collection
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