Exploitation of Surface-Sensitive Electrons in Scanning Electron Microscopy Reveals the Formation Mechanism of New Cubic and Truncated Octahedral CeO(2) Nanoparticles

Abstract

Development of new analytical tools for nanostructures directly contributes to the study of catalysts. By using scanning electron microscopy (SEM) with a newly designed signal enhancer, we study cubic and truncated octahedral cerium oxide (CeO2) nanoparticles, which are composed of smaller primary octahedral CeO2 and are formed through bond formation with hexanedioic acid. The signal enhancer is designed to efficiently collect secondary electrons of kinetic energy less than 10 eV; thus, it greatly improves the S/N ratio. On the basis of the observed SEM images and electron backscattered diffraction patterns of the cross section of the nanoparticles, we discuss the formation mechanism of the nanoparticles and speculate that the primary CeO2 nanocrystals share their edges in the cubic nanoparticles and truncated octahedral nanoparticles. These results will contribute to the preparation of nanostructured metal oxide surfaces with controlled morphologies that could enhance catalytic activity.