High speed phase shifting interferometry using injection locking of the laser frequency to the resonant modes of a confocal Fabry-Perot cavity

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dc.contributor.authorKang, Chu-Shikko
dc.contributor.authorKim, Jong-Ahnko
dc.contributor.authorEom, Tae Bongko
dc.contributor.authorJang, Romako
dc.contributor.authorPark, Hae Yongko
dc.contributor.authorKim, Jae Wanko
dc.date.accessioned2013-03-08T23:44:26Z-
dc.date.available2013-03-08T23:44:26Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2009-02-
dc.identifier.citationOPTICS EXPRESS, v.17, no.3, pp.1442 - 1446-
dc.identifier.issn1094-4087-
dc.identifier.urihttp://hdl.handle.net/10203/94693-
dc.description.abstractWe present a high speed phase shifting interferometer which utilizes the self injection locking of a frequency tunable laser diode. By using a confocal Fabry-Perot cavity made of ultra low expansion glass, and linearly modulating the laser diode current, the laser frequency could be injection locked to the resonant modes of the Fabry-Perot cavity consecutively. It provided equal phase steps to the interferograms which are ideal to be analyzed by the Carre algorithm. The phase step error was evaluated to be about 3 MHz which corresponds to 0.2 nm in length measurement. With this technique, profile measurements are insensitive to external vibration since four 640 x 480 pixels images can be acquired within 4 ms. Difference of two profile measurements, each made with and without vibration isolation, respectively, was evaluated to be 0.5 nm (rms). (C) 2009 Optical Society of America-
dc.languageEnglish-
dc.publisherOptical Soc Amer-
dc.subjectDIODE-
dc.titleHigh speed phase shifting interferometry using injection locking of the laser frequency to the resonant modes of a confocal Fabry-Perot cavity-
dc.typeArticle-
dc.identifier.wosid000263432400031-
dc.identifier.scopusid2-s2.0-59749106315-
dc.type.rimsART-
dc.citation.volume17-
dc.citation.issue3-
dc.citation.beginningpage1442-
dc.citation.endingpage1446-
dc.citation.publicationnameOPTICS EXPRESS-
dc.identifier.doi10.1364/OE.17.001442-
dc.contributor.localauthorPark, Hae Yong-
dc.contributor.nonIdAuthorKang, Chu-Shik-
dc.contributor.nonIdAuthorKim, Jong-Ahn-
dc.contributor.nonIdAuthorEom, Tae Bong-
dc.contributor.nonIdAuthorKim, Jae Wan-
dc.type.journalArticleArticle-
dc.subject.keywordPlusDIODE-
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